Semiconductor Reference Voltage System for Uniform Reliability Testing
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Solution Overview
Problem
Conventional semiconductor integrated circuits face challenges in achieving uniform reliability evaluation due to varying parasitic resistances during reliability tests, leading to non-uniform voltage differences between internal source and ground voltages when connected to a single tester.
Innovation Solution
A system is implemented that provides a constant reference voltage by using a tester with resistors and a multiplexer to generate a test reference voltage, which compensates for parasitic resistances, ensuring a consistent voltage difference between internal source and ground voltages across multiple semiconductor chips.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If an external reference voltage source is employed during reliability evaluation, then the reference voltage can be provided externally, but the internal ground voltage becomes non-constant causing non-uniform voltage difference
Solution Approach 1:
The patent introduces a second ground pad connected through first and second resistors to the tester's ground voltage, creating an intermediary ground reference that is isolated from the tester's ground fluctuations. This intermediary ground pad provides a stable reference point that compensates for parasitic resistance variations, thereby maintaining constant internal ground voltage and uniform voltage differences across multiple semiconductor integrated circuits during reliability evaluation.
2Productivity
If multiple semiconductor integrated circuits are connected to a single tester, then testing efficiency increases, but parasitic resistances cause different voltage drops in each circuit
Solution Approach 1:
The patent segments the ground connection system by providing separate ground pads (first ground pad and second ground pad) for each semiconductor integrated circuit, with each ground pad connected through its own resistors to the tester. This segmentation isolates the parasitic resistance effects for each circuit, preventing cross-interference and ensuring that voltage differences remain uniform across all circuits even when multiple circuits are tested simultaneously on a single tester.
3Ease of operation
If internal voltage source is used in semiconductor integrated circuit, then the circuit can operate independently, but parasitic resistance causes voltage difference to be lower than tester voltage difference
Solution Approach 1:
The patent creates equipotential conditions by connecting the second ground pad through resistors to establish a stable ground reference that matches the tester's ground potential. The reference voltage pad is connected to a node between the resistors, ensuring that the internal voltage source operates with the same reference potential as the tester, thereby eliminating voltage difference discrepancies caused by parasitic resistances while maintaining independent circuit operation.
Data Source
AI summary
A system for providing a reference voltage includes a tester adapted to provide a predetermined current, a first ground pad connected to a ground voltage of the tester, a second ground pad connected between the tester and the first ground pad, the second ground pad being connected to the tester through first and second resistors, a reference voltage pad connected to a node between the first and second resistors, the reference voltage pad adapted to provide a test reference voltage, and a multiplexer connected to the reference voltage pad, the multiplexer configured to output the test reference voltage as a reference voltage during substantial voltage variation.