Non-Contact Semiconductor Series Resistance Characterization
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Solution Overview
Problem
Current measuring methods for semiconductor components, particularly solar cells, are complex and time-consuming, and unable to effectively characterize the series resistance network without electrical contacting, which limits the detection of spatial inhomogeneities and loss mechanisms.
Innovation Solution
A method and device that apply electromagnetic excitation radiation selectively to sub-areas of the semiconductor component, generating charge-carrier pairs and inducing current-flow patterns without electrical contacting, allowing for spatially resolved measurements that mimic the state of an electrically contacted component, thereby characterizing the series resistance network.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If electrical contacts are formed to measure series resistance network, then measurement accuracy is improved, but device complexity and measurement time increase
Solution Approach 1:
The patent replaces the mechanical/electrical contacting system with an optical system. Electromagnetic radiation is used to generate charge carriers and induce current flow patterns without physical contact. The measurement system uses optical detection instead of electrical probes, eliminating the need for complex electrical contacting while maintaining measurement capability for series resistance network characterization.
Solution Approach 2:
The patent introduces electromagnetic radiation as an intermediary between the measurement system and the semiconductor component. The radiation serves as a mediator that can penetrate and interact with the component to generate internal current flows and enable measurement without direct electrical contact, thus simplifying the measurement setup while preserving measurement accuracy.
2Loss of information
If measurements are performed at optimal operating point, then current flow information is improved, but measurement complexity increases due to electrical contacting requirements
Solution Approach 1:
The patent substitutes the electrical contacting method with an optical excitation method to achieve the same goal of measuring current flow information. By using electromagnetic radiation to generate charge carriers and induce current flows, the system obtains current flow data without requiring complex electrical contacting setups, thus reducing measurement complexity while preserving information quality.
3Measurement precision
If spatially resolved measurements are performed, then detection of spatial inhomogeneities is improved, but measurement time increases
Solution Approach 1:
The patent employs periodic modulation of the electromagnetic radiation source to enable time-resolved detection. By modulating the excitation radiation and using synchronous detection, the system can extract spatially resolved information more efficiently, reducing the total measurement time while maintaining the capability to detect spatial inhomogeneities in the semiconductor component.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables quicker, less complex characterization of semiconductor components, including solar cells, by generating current-flow patterns that correspond to electrically contacted states, allowing for non-contact measurement and improved detection of series resistance distribution.
Implementation Method 1
Through the radiation source, electromagnetic radiation, in particular excitation radiation, is applied in this way to the semiconductor component. The charge-carrier pairs generated in this way are separated at the pn junction of the semiconductor component.
Implementation Method 2
The charge-carrier pairs generated in this way are separated at the pn junction of the semiconductor component.
Data Source
AI summary
A measuring method and device for characterizing a semiconductor component (1) having a pn junction and a measuring surface, which has a contacting subarea, covered by a metallization. The method including: A. Planar application of electromagnetic excitation radiation onto the measuring area of the semiconductor component (1) for separating charge carrier pairs in the semiconductor component (1), and B. spatially resolved measurement of electromagnetic radiation originating from the semiconductor component (1) using a detection unit. In one step A, a predetermined excitation subarea of the measuring surface has a predetermined intensity of the excitation radiation and at least one sink subarea of the measuring surface has an intensity of the excitation radiation which is less than the intensity applied to the excitation subarea. The excitation and sink subareas are disposed on opposite sides of said contacting subarea and adjoin it and/or entirely or partially overlap it.