Semiconductor Device Score-Based Module Activation

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Solution Overview

Problem

Existing semiconductor devices face malfunctions due to sharp current fluctuations, leading to voltage drops or increases, which are typically addressed by upsizing chips to absorb these fluctuations, reducing cost competitiveness.

Innovation Solution

A semiconductor device with a table storing operating frequencies and associated scores, a score specifying unit, and an output unit that instructs modules to activate at different times if scores exceed a threshold, preventing malfunctions while maintaining circuit size and cost competitiveness.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If power supply capacity is increased or internal capacity is added to prevent voltage fluctuations, then reliability is improved, but chip size increases

Engineering Contradiction:
Improveprevention of voltage drop or increaseVSAvoidchip size
Core Design Contradiction:
ReliabilityVSArea of stationary object

Solution Approach 1:

The system calculates scores for each module based on their operating frequencies before activation, and uses these scores to determine the activation sequence. By performing this preliminary scoring and sequencing, the system prevents simultaneous activation of high-current modules, thereby avoiding voltage fluctuations without requiring additional power supply capacity or internal capacity circuits.

Inventive Principle:
Principle #10Preliminary action

2Productivity

If modules are activated simultaneously to meet performance requirements, then productivity is improved, but current fluctuations increase causing malfunctions

Engineering Contradiction:
Improvemodule activation speedVSAvoidmalfunction prevention
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The system dynamically adjusts the activation timing of modules based on their calculated scores. Instead of fixed simultaneous activation or static sequential activation, the system uses the score-based sequencing to adaptively control activation timing, allowing modules with lower current impact to activate first while prioritizing high-performance modules, thus balancing productivity and reliability.

Inventive Principle:
Principle #15Dynamics

3Reliability

If power supply margin is increased to absorb current fluctuations, then reliability is improved, but device complexity increases

Engineering Contradiction:
Improvecurrent fluctuation absorptionVSAvoidpower supply unit complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The invention extracts the power management function from the power supply hardware and relocates it to the control logic. Instead of adding hardware components to the power supply unit to absorb current fluctuations, the system uses software-based score calculation and sequencing to prevent the fluctuations in the first place, thereby maintaining reliability while avoiding increased device complexity.

Inventive Principle:
Principle #2Taking out (Extraction)

Data Source

PatentUS10255984B2Semiconductor device and method of controlling the semiconductor device
Publication Date: 2019.04.09 RENESAS ELECTRONICS CORP
  • US10255984B2 patent drawing
  • US10255984B2 patent drawing
  • US10255984B2 patent drawing

AI summary

A malfunction caused by sharp fluctuations in current is prevented while suppressing an increase in circuit size. A semiconductor device includes a plurality of modules. The semiconductor device includes: a table that stores a plurality of operating frequencies in each of the modules and a plurality of scores determined based on the operating frequencies such that the operating frequencies and the scores are associated with each other for each of the modules; a score specifying unit that acquires the clock operating frequencies of the modules and specifies the scores based on the clock operating frequencies with reference to the table; and an output unit that outputs an instruction to activate the modules at different times if the specified scores exceed a predetermined threshold value.