Semiconductor Transistor Layer Layout With Shared Metal Electrodes

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Solution Overview

Problem

Existing semiconductor apparatus techniques are costly and limited in applicability, with a need for a method to reduce costs while maintaining effective performance across various structures.

Innovation Solution

The semiconductor apparatus includes a substrate with a first and second transistor layer, where the highest concentration elements in the semiconductor layers differ, and the conductor layers share common metal elements, with the second conductor layer insulated from the second semiconductor layer and positioned between the second semiconductor layer and the substrate, allowing for cost reduction through shared materials and simplified manufacturing.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If different metal elements are used in conductor layers for different transistor types, then transistor performance is optimized, but manufacturing cost increases due to multiple material procurement and processing

Engineering Contradiction:
Improvetransistor performanceVSAvoidmanufacturing cost
Core Design Contradiction:
ReliabilityVSEase of manufacture

Solution Approach 1:

The patent merges the conductor layers for different transistor types by using the same metal element (aluminum) for both the first conductor layer connected to the first semiconductor layer and the second conductor layer connected to the second semiconductor layer. This consolidation reduces material variety and simplifies the manufacturing process while maintaining electrical connectivity and transistor performance through proper layer configuration and insulation.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The aluminum conductor layers serve multiple functions in the semiconductor apparatus: they act as source/drain electrodes for the first transistor, gate electrodes for the second transistor, and interconnect structures. This multi-functional use of a single metal material reduces procurement costs and simplifies the manufacturing process compared to using different specialized metals for each function.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Reliability

If separate conductor layers are used for each transistor type, then electrical isolation is improved, but device complexity increases

Engineering Contradiction:
Improveelectrical isolationVSAvoidconductor layer configuration
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent introduces an insulating layer as an intermediary between the first conductor layer and the second semiconductor layer, and between the second conductor layer and the first semiconductor layer. This insulating mediator provides the necessary electrical isolation to prevent unwanted interactions while allowing the conductor layers to be configured in a simplified, unified manner without increasing overall device complexity.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Ease of manufacture

If common metal elements are used across conductor layers, then manufacturing cost decreases, but manufacturing precision requirements increase

Engineering Contradiction:
Improvemanufacturing costVSAvoidconductor layer positioning
Core Design Contradiction:
Ease of manufactureVSManufacturing precision

Solution Approach 1:

The patent uses the same metal material (aluminum) for both conductor layers, allowing the manufacturing process to replicate the same deposition and patterning steps for each layer. This copying approach simplifies process control and reduces variability, thereby maintaining manufacturing precision while achieving cost reductions through material standardization.

Inventive Principle:
Principle #26Copying

Data Source

PatentUS20230411402A1Semiconductor apparatus and equipment
Publication Date: 2023.12.21 CANON KK
  • US20230411402A1 patent drawing
  • US20230411402A1 patent drawing
  • US20230411402A1 patent drawing

AI summary

A first element included in a semiconductor layer differs from a second element included in another semiconductor layer, and a third element included in a source electrode is same as a fourth element included in a gate electrode.