Semiconductor Substrate Solder Absorption Portion
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Solution Overview
Problem
In semiconductor devices, excessive joining material can overflow and cause short circuits, leading to increased wire length and thermal resistance due to the need for additional processing or recesses in the circuit board.
Innovation Solution
A semiconductor device configuration with a substrate featuring an element mount portion and a solder absorption portion that extends outward from the mount portion, having higher solder wettability than other areas, allowing surplus solder to flow away from bonding portions and preventing short circuits, while maintaining minimal wire length and solder thickness.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the amount of joining material is increased to ensure proper mounting, then the reliability of the joint is improved, but the joining material may overflow to portions of the circuit board to which the wires are connected, resulting in a short circuit
Solution Approach 1:
The harmful function of the solder absorption portion is extracted and separated from the bonding portions. The solder absorption portion is specifically designed to attract and absorb excess solder material, while the bonding portions are kept separate and protected from solder overflow, thus preventing short circuits while maintaining joint reliability
Solution Approach 2:
The solder absorption portion acts as an intermediary between the element mount portion and the bonding portions. It intercepts and absorbs excess solder material before it can reach the bonding portions, serving as a protective barrier that prevents harmful interactions while allowing the mounting process to proceed
2Object-affected harmful factors
If recesses are formed in the circuit board to prevent solder overflow, then short circuits are prevented, but the wire length increases and thermal resistance increases
Solution Approach 1:
Instead of modifying the bonding portions or wire paths to prevent solder overflow, the harmful function is extracted by adding a dedicated solder absorption portion that actively manages excess solder material. This allows the wires to maintain their original short paths while still preventing short circuits
Solution Approach 2:
The excess solder material, which would normally be a harmful overflow causing short circuits, is converted into a beneficial element by providing a designated absorption area. The solder is redirected to the absorption portion, turning the potential harm into a controlled feature that protects the bonding portions while maintaining efficient wire routing
3Object-affected harmful factors
If additional processing is performed to control solder flow, then short circuits are prevented, but the manufacturing complexity and time increase
Solution Approach 1:
The solder absorption portion is pre-formed on the circuit board before the mounting process. This preliminary preparation ensures that excess solder material is automatically directed to the absorption area during the normal mounting process, eliminating the need for additional complex processing steps or controls during manufacturing
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Effectively suppresses short circuits, reduces wire length, and minimizes thermal resistance by directing excess solder to an absorption area, avoiding contact with bonding portions and maintaining efficient heat dissipation.
Implementation Method 1
a solder absorption portion 44 that extends outward from the element mount portion 42
Implementation Method 2
having higher solder wettability than other areas
Data Source
AI summary
A semiconductor device includes a semiconductor element, a substrate, and a plurality of wires. The semiconductor element has a plurality of electrodes on a first surface. The substrate has an element mount portion to which a second surface of the semiconductor element is joined through a solder joining material, a plurality of bonding portions disposed on a periphery of the element mount portion and spaced apart from each other, and a solder absorption portion extending outwardly from the element mount portion to receive a surplus of the solder joining material and being electrically independent of the plurality of bonding portions. The wires connect the electrodes and the bonding portions. The element mount portion and the solder absorption portion have a higher solder wettability than another portion of the substrate.


