Semiconductor Memory Stack Slits for Stable End-Cell Characteristics
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Solution Overview
Problem
Existing semiconductor memory devices face challenges in maintaining consistent performance due to characteristic fluctuations at the end portions of stacked bodies, which can be attributed to the presence of dummy regions that do not contribute to the device's functionality.
Innovation Solution
The implementation of a structure with slits and pillars in the stacked body, where the upper end portions of certain slits are fully or partially covered by strips of material, and the inclusion of dummy pillars in end portions to maintain periodicity and accuracy, reducing the area of non-functional dummy regions.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If dummy regions are provided at end portions of stacked body to prevent characteristic fluctuation, then reliability of memory cells is improved, but area occupied by non-functional regions increases
Solution Approach 1:
The stacked body is divided into multiple segments by introducing slits that extend in the stacking direction. These slits partition the structure into distinct regions, allowing the end portions to be treated differently while maintaining overall functionality. The segmentation enables reduced dummy regions by creating independent structural units that can stabilize characteristics locally without requiring extensive dummy areas.
Solution Approach 2:
Different structural configurations are applied to different regions of the stacked body. Specifically, the end portions are equipped with slits and covering structures that provide local stabilization, while the central regions maintain their original configuration. This local quality approach allows characteristic stability to be achieved precisely where needed (at end portions) without extending dummy regions throughout the entire structure.
2Area of stationary object
If slits are introduced in stacked body to reduce dummy region area, then area efficiency is improved, but manufacturing precision requirements increase
Solution Approach 1:
Upper end portions of the slits are covered with conductive or insulating materials before the pillar formation process. This preliminary covering action establishes precise reference boundaries that guide subsequent pillar formation, ensuring that pillars are formed with accurate positioning and dimensions. The pre-established covering structures serve as templates that reduce the precision burden on later manufacturing steps.
Solution Approach 2:
The covering materials (conductive or insulating layers) introduced at the slit openings act as intermediary structures that mediate between the slit geometry and the pillar formation process. These intermediary layers provide well-defined interfaces and boundaries that facilitate precise pillar formation, effectively translating the complex slit structure into manageable formation zones for the pillars.
3Stability of the object's composition
If strips of material cover upper end portions of slits, then structural stability is improved, but device complexity increases
Solution Approach 1:
The covering structures at the slit openings serve multiple functions simultaneously: they provide structural stability to the stacked body, define boundaries for pillar formation, and can serve as electrical connections or isolation elements depending on whether conductive or insulating materials are used. This multi-functionality reduces the need for separate dedicated structures, thereby limiting the increase in device complexity despite the added stability features.
Data Source
AI summary
A semiconductor memory device includes a stacked body including a plurality of first layers and a plurality of second layers alternately stacked one by one, a plurality of slits extending in the stacked body in a stacking direction of the stacked body and in a first direction intersecting the stacking direction, the slits dividing the stacked body in a second direction intersecting the first direction and the stacking direction, and a plurality of pillars disposed between the plurality of slits and extending in the stacked body in the stacking direction.


