Semiconductor Device Substrate Bias Circuit for Temperature Compensation

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Solution Overview

Problem

The threshold voltage of MOS transistors in semiconductor devices varies with temperature, leading to performance and reliability issues due to unadjusted substrate bias.

Innovation Solution

A semiconductor device with a substrate bias generation circuit that compares reference and monitoring voltages to adjust the substrate bias of PMOS and NMOS transistors, maintaining constant threshold voltages regardless of temperature through well or source voltage adjustments.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If substrate bias is not adjusted, then the device structure remains simple, but the threshold voltage varies with temperature causing performance degradation

Engineering Contradiction:
Improvethreshold voltage stabilityVSAvoidcircuit complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent implements a feedback mechanism where the substrate bias generation circuit continuously monitors the threshold voltage of MOS transistors and adjusts the substrate bias accordingly. This closed-loop control ensures that threshold voltage remains stable across temperature variations, directly resolving the contradiction between reliability and device complexity by introducing minimal but effective feedback control.

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The patent changes the substrate bias parameter dynamically based on temperature conditions. By adjusting the substrate bias voltage through the substrate bias generation circuit, the threshold voltage of MOS transistors is compensated for temperature effects, maintaining stable device performance without requiring complete redesign of the device structure.

Inventive Principle:
Principle #35Parameter changes

2Stability of the object's composition

If substrate bias is adjusted to maintain constant threshold voltage, then threshold voltage stability improves, but the circuit complexity increases

Engineering Contradiction:
Improvethreshold voltage constancyVSAvoidsubstrate bias generation circuit
Core Design Contradiction:
Stability of the object's compositionVSDevice complexity

Solution Approach 1:

The substrate bias generation circuit is designed to automatically adjust substrate bias without external intervention. The circuit self-regulates by monitoring threshold voltage changes and applying appropriate bias adjustments, enabling the system to maintain threshold voltage constancy autonomously and reducing the need for complex external control mechanisms.

Inventive Principle:
Principle #25Self-service

3Reliability

If temperature variations are not compensated, then the device structure remains simple, but performance and reliability deteriorate

Engineering Contradiction:
Improveperformance reliabilityVSAvoidtemperature compensation circuit
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent utilizes parameter changes in substrate bias voltage to compensate for temperature variations. The substrate bias generation circuit adjusts the substrate bias parameter in response to temperature changes, thereby maintaining constant threshold voltage and ensuring performance reliability across different operating temperatures without requiring complex thermal management structures.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS9953714B2Semiconductor device
Publication Date: 2018.04.24 KIOXIA CORP
  • US9953714B2 patent drawing
  • US9953714B2 patent drawing
  • US9953714B2 patent drawing

AI summary

A semiconductor device includes a first circuit configured to generate a first voltage based on a first current, a second circuit that includes a first transistor of a first conductivity type having a first terminal, a second terminal, and a first gate, the second circuit configured to generate a second voltage based on a voltage difference between the first terminal and the second terminal, and a third circuit configured to compare the first voltage and the second voltage, and generate a third voltage for adjusting a substrate bias of the first transistor, based on the comparison result.