Semiconductor Substrate Indentation for Fracture Detection

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Solution Overview

Problem

Existing semiconductor chips face challenges in reliably detecting substrate fractures, which can lead to restricted or total failure of electronic systems, especially under mechanical loading, making it difficult to identify and mitigate the effects of such fractures within the system.

Innovation Solution

Incorporating an indentation in the substrate with a conductor track and crossover, allowing for the injection of a test signal to detect substrate fractures by monitoring changes in conductivity, and providing redundant output components to ensure continued functionality.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If substrate fracture detection techniques are implemented, then reliability is improved, but device complexity increases

Engineering Contradiction:
Improvesubstrate fracture detection reliabilityVSAvoiddetection system complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The conductor track itself serves as the detection element by utilizing its own electrical conductivity properties. The track automatically indicates substrate fracture through changes in its electrical characteristics when crossed by the indentation, eliminating the need for separate detection sensors or complex monitoring systems.

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The patent replaces potential mechanical fracture detection methods with an electrical detection approach. By using electrical conductivity measurement of the conductor track, the system substitutes mechanical sensing with electrical field-based detection, simplifying the overall detection mechanism.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Reliability

If redundant components are provided for fail-safety, then reliability is improved, but device complexity increases

Engineering Contradiction:
Improvefail-safetyVSAvoidcomponent redundancy
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The redundant output components are prepared in advance and can be activated upon detection of substrate fracture. The system pre-configures alternative signal paths and output components that remain standby until needed, allowing rapid failover without requiring complex real-time decision-making or switching mechanisms.

Inventive Principle:
Principle #10Preliminary action

3Ease of manufacture

If the semiconductor chip is subjected to mechanical loading during overmolding, then manufacturing process is completed, but substrate fracture occurs

Engineering Contradiction:
Improveovermolding processVSAvoidsubstrate strength
Core Design Contradiction:
Ease of manufactureVSStrength

Solution Approach 1:

The indentation in the substrate acts as a predetermined stress relief feature that absorbs and distributes mechanical loads during the overmolding process. By creating this localized depression beforehand, the substrate is pre-conditioned to handle the mechanical stresses of manufacturing without fracturing, as the indentation provides a compliance zone that cushions impact forces.

Inventive Principle:
Principle #11Beforehand cushioning (Prior cushioning)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables reliable detection of substrate fractures, reduces the impact on integrated circuit functionality, and allows for targeted safeguard measures such as switching to redundant components, thereby enhancing fail-safety and preventing safety deficiencies.

Implementation Method 1

a conductor track (121) and a crossover between the indentation (110) of the substrate and the conductor track (121)... enabling detection of the test signal at the second end of the conductor track

Methodology Applied
Scientific EffectElectrical conduction: Conduction (electrical)

Data Source

PatentUS10705132B2Semiconductor chip with fracture detection
Publication Date: 2020.07.07 INFINEON TECHNOLOGIES AG
  • US10705132B2 patent drawing
  • US10705132B2 patent drawing
  • US10705132B2 patent drawing

AI summary

A method including feeding a test signal into a first end of a conductor track of a semiconductor chip, wherein the conductor track crosses an indentation of a substrate of the semiconductor chip; and detecting the test signal at a second ends of the conductor track, which wherein the detected test signal is indicative of fracture of the substrate of the semiconductor chip at the indentation.