Semiconductor Temperature and Current Estimation via Dual Potential Difference
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Solution Overview
Problem
Conventional techniques for measuring current and temperature in semiconductor devices require either a current sensor, a temperature sensor, or a complicated apparatus like a voltage controller or a gate voltage measuring device.
Innovation Solution
A semiconductor characteristics measuring apparatus that estimates the current and temperature of a semiconductor device by measuring two potential differences using a first and second potential difference measuring device, without the need for current or temperature sensors, and using stored relationships between these potential differences and the device's characteristics.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional techniques (current sensor, temperature sensor, sense cell, voltage controller, gate voltage measuring apparatus) are used to measure current and temperature, then measurement precision is improved, but device complexity and cost increase
Solution Approach 1:
The patent uses voltage measurements as a copy or proxy for directly measuring current and temperature. By measuring voltage at connection terminals and using stored relationship data, the system indirectly obtains current and temperature information without requiring specialized sensors, thus reducing device complexity while maintaining measurement capability
Solution Approach 2:
The patent replaces physical sensors (current sensor, temperature sensor) with an electrical measurement system. Instead of using dedicated sensing components, the invention substitutes a voltage measurement apparatus that reads voltage differences and correlates them to current and temperature through pre-stored relationship data
2Measurement precision
If conventional techniques (current sensor, temperature sensor, sense cell) are used to measure current and temperature, then measurement precision is improved, but cost increases
Solution Approach 1:
The patent makes the voltage measurement apparatus perform multiple functions: it simultaneously provides information about both current and temperature through a single measurement system. The same voltage measurement setup and relationship data structure are used to derive both parameters, eliminating the need for separate specialized sensors and reducing overall system cost
Solution Approach 2:
The invention uses voltage measurements as a cost-effective copy mechanism to obtain current and temperature information. By storing relationship data that correlates voltage to both current and temperature, the system avoids the high cost of specialized sensors while maintaining the ability to monitor both parameters
3Measurement precision
If specialized sensors (current sensor, temperature sensor) are used, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The patent merges the measurement of current and temperature into a single integrated system. By using one voltage measurement apparatus to simultaneously provide both current and temperature information through relationship data, the invention combines what would traditionally require separate sensor systems into a unified approach, reducing overall system complexity
Data Source
AI summary
In a semiconductor characteristics measuring apparatus, a first potential difference measuring device measures a first potential difference between two connection terminals connected to first and second main electrodes, respectively, of a power semiconductor element. A second potential difference measuring device measures a second potential difference between two connection terminals connected at different positions of a current path of a main current to or from the second main electrode. When values of an element temperature and a main current specified based on a measurement value of the first potential difference match values of an element temperature and a main current specified based on a measurement value of the second potential difference, a processing device outputs the matching values of the element temperature and the main current as estimates at a present time point.