Semiconductor Temperature Detection Circuit Using Dual Oscillators
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Solution Overview
Problem
Conventional semiconductor temperature detection circuits lack sufficient precision, leading to potential erroneous operations due to temperature variations and are not effectively adjusted for manufacturing process variations.
Innovation Solution
A semiconductor device incorporating first and second oscillators with positive and negative temperature characteristics, respectively, and a temperature signal generation circuit to enhance detection precision, along with a tuning circuit that adjusts electrical characteristics using memory and tuning code selection to account for manufacturing process variations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional temperature detection circuits are used, then device complexity is reduced, but temperature detection precision is insufficient
Solution Approach 1:
The patent combines multiple oscillators with different temperature characteristics (positive and negative) into a single temperature detection circuit. By merging these oscillators and their frequency extraction circuits, the system achieves high-precision temperature detection without requiring separate detection circuits for each oscillator, thus improving precision while controlling overall complexity.
Solution Approach 2:
The patent introduces a frequency extraction circuit as an intermediary component that processes the output signals from multiple oscillators. This intermediary circuit converts the oscillating signals into frequency information that can be accurately measured and processed, enabling precise temperature detection without directly measuring temperature, thereby improving measurement precision.
2Adaptability or versatility
If fixed tuning codes are stored in memory, then device complexity is reduced, but adaptability to manufacturing process variations is insufficient
Solution Approach 1:
The patent transforms the static memory storage system into a dynamic one by enabling rewriting of tuning codes. The memory circuit can now be updated with new tuning codes based on actual manufacturing process variations, allowing the system to adapt to different production conditions. This dynamic capability improves adaptability while the structured approach to code management keeps complexity controlled.
Solution Approach 2:
The patent changes the parameter of tunability by allowing modification of tuning codes in the memory circuit. Instead of using fixed, hard-coded values, the system can now adjust tuning parameters (tuning codes) based on measured characteristics during manufacturing. This parameter change enables the system to adapt to manufacturing variations without requiring complete redesign, thus improving adaptability.
3Reliability
If temperature detection precision is improved, then reliability is improved, but device complexity increases
Solution Approach 1:
The patent merges multiple oscillators with complementary temperature characteristics into a unified detection system. By combining their frequency outputs and processing them through a shared frequency extraction and temperature signal generation circuit, the system achieves enhanced reliability through redundancy and cross-validation while avoiding the complexity of entirely separate detection systems.
Solution Approach 2:
The patent implements a feedback mechanism where the temperature signal generation circuit continuously monitors the frequency variations from the oscillators and generates temperature signals that feed back to the tuning circuit. This feedback loop enables continuous adjustment and compensation, improving reliability by ensuring the system operates correctly under varying temperature conditions.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution provides high-precision temperature detection and adjustment of semiconductor device characteristics, preventing erroneous operations by sensitively varying the temperature signal and rewriting tuning codes to match manufacturing process variations.
Implementation Method 1
The first oscillator generates a first clock signal having positive temperature characteristics with respect to a frequency
Implementation Method 2
The second oscillator generating a second clock signal having negative temperature characteristics with respect to a frequency
Data Source
AI summary
There is provided a technique which is capable of detecting a temperature of a semiconductor device with high precision. A temperature detection circuit detecting a temperature of a semiconductor device includes a first short-cycle oscillator generating a first clock signal having positive temperature characteristics with respect to a frequency, a second short-cycle oscillator generating a second clock signal having negative temperature characteristics with respect to the frequency, and a temperature signal generation unit generating a temperature signal which is varied according to the temperature of the semiconductor device based on the first and second clock signals.