Semiconductor Temperature Protection Using Estimated Thermal Values
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Solution Overview
Problem
Temperature sensors in high-power electric systems face noise interference when transmitting signals to low-power control systems, leading to decreased precision in detecting overheating in semiconductor elements, potentially resulting in erroneous protection measures.
Innovation Solution
A temperature protection device comprising a temperature detector, estimator, and overheating protection components that use both detected and estimated temperatures to determine an overheated state, with noise reduction strategies to enhance precision, including the use of threshold temperatures and differential calculations to accurately assess semiconductor element temperatures.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Speed
If the detected temperature is used directly for protection control, then the response speed is improved, but erroneous protection operations may occur due to noise
Solution Approach 1:
The system performs preliminary action by calculating the temperature estimation value in advance based on the detected temperature, loss values, and thermal characteristics before making protection control decisions. This preliminary estimation filters out noise and provides a more reliable basis for timely and accurate protection operations
2Measurement precision
If noise reduction filtering is applied to the detection signal, then the temperature detection precision is improved, but the response time increases
Solution Approach 1:
The patent changes the parameter representation from direct temperature detection to an estimated temperature value that incorporates multiple factors (detected temperature, loss values, thermal resistance). This parameter transformation achieves noise reduction without significant time delay by using readily available operational data
Data Source
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AI summary
A temperature protection device includes a temperature detector (31, 32, 33, 34, 35, 36), a temperature estimator (64), a overheated state determining component (37, 65) and an overheating protection component (66). The temperature detector (31, 32, 33, 34, 35, 36) detects a temperature of a semiconductor component (3). The temperature estimator (64) estimates an estimated temperature of the semiconductor component (3). The overheated state determining component (37, 65) determines whether the semiconductor component (3) is in an overheated state based on the detected temperature and the estimated temperature by using a first estimated temperature as the estimated temperature at a time point when the detected temperature has reached a first threshold temperature and a second estimated temperature that is estimated subsequent to the time point as the estimated temperature when the detected temperature has reached the first threshold temperature. The overheating protection component (66) protects the semiconductor component (3) from the overheating based on a determination made by the overheated state determining component (37, 65).