Semiconductor Apparatus Temperature Compensation Reference Voltage

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Solution Overview

Problem

Semiconductor apparatuses malfunction due to variations in transistor characteristics caused by temperature changes, despite constant internal voltages, leading to inconsistent current flow between the drain and source.

Innovation Solution

A semiconductor apparatus that includes a temperature code generation circuit, control code generation circuit, and reference voltage generation circuit to adjust internal voltages based on temperature measurements before and after heating, ensuring stable operation by generating and comparing temperature codes and adjusting reference voltages accordingly.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Stability of the object's composition

If internal voltages are kept constant, then voltage stability is maintained, but transistor characteristics vary with temperature causing malfunction

Engineering Contradiction:
Improvevoltage stabilityVSAvoidtransistor operation reliability
Core Design Contradiction:
Stability of the object's compositionVSReliability

Solution Approach 1:

The reference voltage is made dynamically adjustable based on temperature conditions. The voltage adjustment block modifies the reference voltage level in response to temperature codes, allowing the system to adapt to temperature changes rather than maintaining a fixed voltage level, thus resolving the contradiction between voltage stability and temperature-dependent reliability

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The system changes the voltage parameter (reference voltage level) in response to temperature variations. By detecting temperature through the temperature measurement block and adjusting the reference voltage accordingly, the system maintains proper transistor operation across different temperature conditions while resolving the conflict between constant voltage and temperature-adaptive operation

Inventive Principle:
Principle #35Parameter changes

2Reliability

If voltage levels are adjusted according to temperature, then transistor reliability improves, but system complexity increases

Engineering Contradiction:
Improvetransistor operation reliabilityVSAvoidvoltage adjustment system complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The system replaces complex continuous voltage regulation mechanisms with a simplified digital approach using temperature codes and discrete voltage adjustment levels. The temperature measurement block generates digital codes that directly control the voltage adjustment block, substituting a potentially complex analog control system with a more manageable digital control scheme

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The temperature measurement block and code generation circuits serve as intermediaries between the temperature sensor and the voltage adjustment mechanism. These intermediary blocks translate temperature information into standardized codes that the voltage adjustment block can process, simplifying the overall system architecture while maintaining reliability

Inventive Principle:
Principle #24Intermediary (Mediator)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution effectively maintains stable transistor operation by adjusting internal voltages in response to temperature changes, reducing the likelihood of malfunction and ensuring consistent performance across varying temperatures.

Implementation Method 1

a heater that generates heat for an enable period of the heating enable signal

Methodology Applied
Scientific EffectHeating: Heating

Data Source

PatentUS9915964B2Semiconductor apparatus
Publication Date: 2018.03.13 MIMIRIP LLC
  • US9915964B2 patent drawing
  • US9915964B2 patent drawing
  • US9915964B2 patent drawing

AI summary

A semiconductor apparatus includes a control block that generates a first control signal, a second control signal, and a heating enable signal in response to an enable signal and a heating control signal, a temperature measurement block that generates a temperature code corresponding to temperature in response to the first and second control signals, a heater that generates heat while the heating enable signal is being enabled, a code latch block that stores the temperature code in response to the first and second control signals, and outputs a first code and a second code, a control code generation circuit that generates a signal by performing an operation on the first and second codes, and generates a control code by comparing the signal with a preset code, and a reference voltage generation circuit configured to change a voltage level of a reference voltage in response to the control code.