Semiconductor Temperature Sensor Code Stability
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Solution Overview
Problem
Digital temperature sensors in semiconductor devices experience noise due to significant code changes from small temperature variations, leading to inaccurate temperature representation and potential device performance deterioration.
Innovation Solution
A semiconductor device with a sensing voltage generator, code generator, and code correction component that generates a temperature voltage, temporary code, and correction code to minimize code changes from small temperature variations, ensuring accurate operation voltage generation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the DTS divides the temperature into a plurality of ranges and outputs codes corresponding to the non-overlapping ranges, then the temperature measurement coverage is improved, but the code changes significantly even with small temperature changes at boundary regions
Solution Approach 1:
The temperature range is divided into multiple sub-ranges with overlapping boundary regions. Each sub-range corresponds to a specific code value, and adjacent sub-ranges share boundary temperature points. This segmentation allows the system to maintain comprehensive temperature coverage while reducing code volatility at boundaries through the overlap mechanism.
Solution Approach 2:
The patent pre-defines multiple sub-ranges with overlapping boundary regions before temperature measurement occurs. By establishing these overlapping ranges in advance, the system prepares a structure where boundary temperature points belong to multiple sub-ranges, thereby preventing significant code changes when temperature fluctuates near boundaries.
2Device complexity
If the DTS outputs codes for non-overlapping temperature ranges, then the device complexity is reduced, but the noise increases due to significant code changes from small temperature variations
Solution Approach 1:
The temperature measurement system is segmented into multiple sub-ranges with overlapping boundaries. This segmentation approach maintains relatively simple device structure while reducing noise by ensuring that small temperature variations near boundary points do not cause large code transitions, as the overlapping regions provide a buffer zone.
Solution Approach 2:
The patent changes the parameter of temperature range overlap from zero (non-overlapping) to a positive value (overlapping). This parameter change allows the system to maintain simple device structure while significantly reducing noise by preventing abrupt code changes at temperature boundaries.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution reduces noise and minimizes code changes caused by small temperature changes, enhancing the accuracy of temperature representation and maintaining device performance.
Implementation Method 1
a sensing voltage generator configured to generate a temperature voltage having a voltage level determined according to an internal temperature of the semiconductor device
Data Source
AI summary
The present technology relates to a semiconductor device and a method of operating the same. The semiconductor device includes a sensing voltage generator configured to generate a temperature voltage having a voltage level determined according to an internal temperature of the semiconductor device and a reference voltage having a constant voltage level, a code generator configured to generate a temporary code including a sensing code value corresponding to the internal temperature and a boundary value indicating whether the internal temperature is included in a boundary portion associated with at least one temperature range corresponding to the sensing code value based on the temperature voltage and the reference voltage, and a code correction component configured to generate a correction code for generating an operation voltage of the semiconductor device by correcting the temporary code, based on the temporary code and a previously generated correction code.