Semiconductor Test System Concurrent Data and Leakage Current Testing

Solution Overview

Problem

Existing semiconductor testing methods require separate tests for data and leakage current, increasing cost and time due to the inability to perform a leakage current test concurrently with data tests.

Innovation Solution

A method and system that allow simultaneous data and leakage current testing by performing a write operation in a test mode, switching to a normal mode for read operations, and using data read in the normal mode to determine test results, thereby integrating both tests into a single operation.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If separate tests are performed for data and leakage current, then test accuracy is improved, but testing time and cost increase

Engineering Contradiction:

Improvetest accuracyVSAvoidtesting time

Core Design Contradiction:

Measurement precisionVSLoss of time

Solution Approach 1:

The patent combines data test and leakage current test into a single integrated test operation. The test device performs both tests simultaneously by writing test data to the semiconductor apparatus in test mode, then reading back the data in normal mode to detect both data integrity and leakage current issues in one process, thereby reducing testing time while maintaining test accuracy through the use of mode switching mechanisms.

Inventive Principle:

Principle #5Merging (Combining)

Solution Approach 2:

The test device is designed with multi-functionality to perform both data testing and leakage current testing using the same test infrastructure. By utilizing mode switching between test mode and normal mode, the same write and read operations serve dual purposes: verifying data correctness and detecting leakage current paths, thus eliminating the need for separate dedicated test equipment or procedures.

Inventive Principle:

Principle #6Universality (Multi-functionality)

2Reliability

If separate tests are performed for data and leakage current, then test reliability is improved, but manufacturing cost increases

Engineering Contradiction:

Improvetest reliabilityVSAvoidmanufacturing cost

Core Design Contradiction:

ReliabilityVSEase of manufacture

Solution Approach 1:

The patent merges data test and leakage current test into a single integrated test operation. The test device performs both tests simultaneously by writing test data to the semiconductor apparatus in test mode, then reading back the data in normal mode to detect both data integrity and leakage current issues in one process, thereby reducing testing time while maintaining test accuracy through the use of mode switching mechanisms.

Inventive Principle:

Principle #5Merging (Combining)

Solution Approach 2:

The test device is designed with multi-functionality to perform both data testing and leakage current testing using the same test infrastructure. By utilizing mode switching between test mode and normal mode, the same write and read operations serve dual purposes: verifying data correctness and detecting leakage current paths, thus eliminating the need for separate dedicated test equipment or procedures.

Inventive Principle:

Principle #6Universality (Multi-functionality)

Data Source

PatentUS9418757B2Method for testing semiconductor apparatus and test system using the same

Publication Date: 2016.08.16 MIMIRIP LLC

AI summary

This technique may include a semiconductor apparatus configured to perform data read/write operations in a test mode or a normal mode and a tester configured to simultaneously perform a data test and a leakage current test through a write operation using data read by a read operation in the normal mode after writing data into the semiconductor apparatus in the test mode.