Semiconductor Test Connecting Unit with Selective Cable Coupling

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Solution Overview

Problem

Conventional methods require separate printed circuit boards with specific patterns to be manufactured for each type of semiconductor chip, making it inefficient to perform electrical tests on semiconductor chips with varying contact terminal patterns, as the pattern on the printed circuit board cannot be modified after manufacturing.

Innovation Solution

A connecting unit with a plurality of connectors and cables that can selectively connect to semiconductor chips with various patterns of electrical connection terminals, using conductive protrusions, support bodies, and hook bodies to facilitate electrical connection and disconnection, allowing for direct connection to the semiconductor chips without a conventional printed circuit board.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a printed circuit board with a specific pattern is manufactured to correspond to the contact terminals of semiconductor chips, then electrical connection is achieved, but the pattern cannot be modified after manufacturing and separate boards must be prepared for different chip patterns

Engineering Contradiction:
Improveelectrical connection reliabilityVSAvoidadaptability to different contact terminal patterns
Core Design Contradiction:
ReliabilityVSAdaptability or versatility

Solution Approach 1:

The printed circuit board is divided into multiple selectable connection patterns, where only the required pattern is activated through selective connection of conductive protrusions to corresponding cable groups, allowing a single board to serve multiple chip types

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The connection pattern is made dynamically selectable through the coupling unit mechanism, which allows conductive protrusions to be connected or disconnected from cable groups based on the specific semiconductor chip being tested, enabling pattern reconfiguration without manufacturing new boards

Inventive Principle:
Principle #15Dynamics

2Reliability

If separate printed circuit boards are prepared for each semiconductor chip pattern, then accurate electrical connection is achieved, but device complexity and manufacturing cost increase

Engineering Contradiction:
Improveelectrical connection accuracyVSAvoidnumber of printed circuit boards required
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

A single printed circuit board is designed with multiple connection patterns integrated into it, allowing the same board to accurately connect to different semiconductor chip patterns by selecting and activating the appropriate connection pattern through the coupling unit and conductive protrusion mechanism

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Manufacturing precision

If the pattern on the printed circuit board is fixed after manufacturing, then manufacturing precision is maintained, but ease of manufacture decreases as re-manufacturing is required for different patterns

Engineering Contradiction:
Improvepattern accuracyVSAvoidease of pattern reconfiguration
Core Design Contradiction:
Manufacturing precisionVSEase of manufacture

Solution Approach 1:

Multiple connection patterns are pre-formed on the printed circuit board during manufacturing, but remain inactive until needed. The required pattern is then activated through selective connection of conductive protrusions to cable groups, combining manufacturing precision with operational flexibility

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS8482308B2Connecting unit to test semiconductor chips and apparatus to test semiconductor chips having the same
Publication Date: 2013.07.09 SAMSUNG ELECTRONICS CO LTD
  • US8482308B2 patent drawing
  • US8482308B2 patent drawing
  • US8482308B2 patent drawing

AI summary

A connecting unit to test a semiconductor chip and an apparatus to test the semiconductor chip having the same include a plurality of connectors, on which a semiconductor chip having a certain pattern of electrical connection terminals, having a plurality of holes, cables configured to electrically connect the electrical connection terminals to the exterior, and coupling units configured to selectively electrically connect the cables to the electrical connection terminals through the holes. Therefore, it is possible to perform electrical tests of semiconductor chips having various patterns of electrical connection terminals and receive the semiconductor chips in a tray at a time.