Semiconductor Test Protocol Dynamic Error Rate Adjustment

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Solution Overview

Problem

Current semiconductor device testing protocols are inefficient, leading to late detection of quality issues, resulting in unnecessary testing overkill, which can disqualify acceptable devices and reduce production yields, while the iterative process of modifying tests is slow and resource-intensive.

Innovation Solution

A real-time optimized testing protocol that uses an integrated test program with dynamically selected test items, where error rates are computed and compared to reference values, allowing for immediate modification of the test program to optimize testing without recompilation or reinstallation, using a centralized server to manage automated testers and adjust test sequences based on actual data.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If testing programs are expanded and enhanced to detect quality problems, then detection reliability is improved, but testing time increases

Engineering Contradiction:

Improvequality problem detectionVSAvoidtesting time

Core Design Contradiction:

ReliabilityVSLoss of time

Solution Approach 1:

The test program is made dynamic through real-time modification capabilities. The system can adjust test items, parameters, and sequences based on actual device performance data, transitioning from static to adaptive testing that responds to measured characteristics

Inventive Principle:

Principle #15Dynamics

Solution Approach 2:

The system implements feedback loops where test results are analyzed and used to modify subsequent test programs. Error rates from sample devices feed back into the testing protocol to optimize future tests, creating a continuous improvement cycle

Inventive Principle:

Principle #23Feedback

2Productivity

If manual iterative test modification is performed, then testing optimization is achieved, but development time and resource consumption increase

Engineering Contradiction:

Improvetesting optimizationVSAvoidtest development time

Core Design Contradiction:

ProductivityVSLoss of time

Solution Approach 1:

The system performs self-optimization by automatically analyzing test results and modifying test programs without requiring manual engineer intervention. The automated modification process eliminates time-consuming manual editing, compilation, and installation steps

Inventive Principle:

Principle #25Self-service

Solution Approach 2:

Manual mechanical processes of test program modification are replaced with automated software-based modification. The system uses programmable logic to automatically generate and apply test modifications, substituting human manual work with automated computational processes

Inventive Principle:

Principle #28Mechanics substitution (Replace mechanical system)

3Reliability

If comprehensive testing is performed to ensure quality, then product quality is maintained, but production yield decreases due to testing overkill

Engineering Contradiction:

Improveproduct qualityVSAvoidproduction yield

Core Design Contradiction:

ReliabilityVSProductivity

Solution Approach 1:

The system dynamically changes testing parameters such as the number of test items, test depth, and selection criteria based on actual device characteristics. This allows the testing intensity to be adjusted to match actual quality needs rather than applying uniform comprehensive testing

Inventive Principle:

Principle #35Parameter changes

Data Source

PatentUS7689876B2Real-time optimized testing of semiconductor device

Publication Date: 2010.03.30 SAMSUNG ELECTRONICS CO LTD

AI summary

A method and system for testing a semiconductor device is disclosed. The method provides an integrated test program defined by a plurality of test items, and a test program defined by a sub-set of the test items. Test data is derived by batch sample testing of the semiconductor device, and an error rate for a test item is computed and then compared to a reference data value. On the basis of the comparison between the error rate and the reference data value, the test program may be modified in real-time.