Semiconductor Test Equipment for Undivided PCBs

The test equipment is designed with a universal testing platform that can accommodate multiple types of undivided PCBs with different unit PCB arrangements. The system includes a loading part with a loading stage that can receive various undivided PCB configurations, and a test part with a test stage that can adapt to different testing requirements. The controller is configured to control different operations based on the type of undivided PCB loaded, enabling the equipment to efficiently test various semiconductor device configurations without requiring separate specialized equipment for each arrangement type.

The test equipment incorporates automated operations where the loading stage automatically loads undivided PCBs onto the testing platform, and the controller automatically executes testing sequences based on pre-configured parameters. The system includes automatic classification functionality that separates tested undivided PCBs into different categories based on test results, eliminating the need for manual sorting. This automation significantly improves testing speed while the modular design of the automated system keeps the complexity manageable through standardized components and procedures.

The system performs preliminary classification of undivided PCBs at the loading stage before they enter the main testing sequence. The controller is pre-configured with testing parameters and sequences corresponding to different types of undivided PCBs, so that once a PCB is loaded and identified, the appropriate test sequence can be immediately executed without delays. This preliminary preparation of testing parameters and classification criteria enables comprehensive testing to be performed efficiently, maintaining both accuracy and reduced cycle time.