Semiconductor Test Apparatus Noise Injection for Voltage Resistance
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Solution Overview
Problem
Existing semiconductor test apparatuses cannot effectively check resistance characteristics against variations in pulse-like power supply voltages, particularly impulse noise, which is crucial for modern semiconductor devices operating with reduced voltages.
Innovation Solution
A semiconductor test apparatus that includes a voltage source, a decision processor, and a noise generator capable of superimposing impulse-like or periodic pulse-like noise voltages on the power supply to the Device Under Test (DUT) during a test sequence, allowing for the evaluation of resistance characteristics against these voltage variations. The noise generator can synchronize with the DUT's clock signal and adjust noise amplitude independently, enabling precise testing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a power supply voltage is fixedly varied while the test pattern is being executed, then the resistance characteristics against power supply voltage changes can be checked, but the resistance characteristics against pulse-like noise cannot be checked
Solution Approach 1:
The patent applies periodic action by superimposing periodic pulse-like noise voltages on the power supply voltage during test execution. The noise generator creates periodic disturbances at specific frequencies and duty cycles, allowing the system to evaluate resistance characteristics against pulsed voltage variations while maintaining continuous test operation.
Solution Approach 2:
The patent implements dynamics by making the noise voltage parameters adjustable and variable during testing. The system can dynamically change noise amplitude, frequency, and timing to simulate different pulse-like noise conditions, enabling versatile testing of resistance characteristics under various transient voltage scenarios.
2Measurement precision
If the noise voltage amplitude is increased to detect weak circuit blocks, then the measurement precision improves, but the device complexity increases
Solution Approach 1:
The patent applies parameter changes by allowing independent adjustment of noise voltage amplitude, frequency, and timing parameters. The system modifies these electrical parameters to optimize detection precision for different circuit conditions without requiring complex hardware changes, achieving high measurement precision through flexible parameter control.
Solution Approach 2:
The patent implements feedback by using test results to identify weak circuit blocks and then adjusting noise voltage parameters to further investigate specific addresses. The system feeds back failure information to refine subsequent testing, improving detection precision through iterative parameter optimization based on observed circuit responses.
Data Source
AI summary
In a semiconductor test apparatus, a voltage source generates a power supply voltage to be supplied to a DUT. A decision processor makes the DUT execute a predetermined test sequence. A noise generator superimposes a periodic pulse-like noise voltage on the power supply voltage to be supplied to the DUT, while the test sequence is being executed. The noise generator superimposes a noise voltage synchronized with a clock signal to be supplied to the DUT.