Semiconductor Test Power Circuit for Single-Supply Dual-Voltage Operation
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Solution Overview
Problem
Conventional test operations for nonvolatile memory devices face inefficiencies due to limitations in test equipment that can only supply one power supply voltage, leading to unstable voltage levels and increased testing time when trying to apply two power supply voltages, resulting in excess current consumption and prolonged testing periods.
Innovation Solution
A semiconductor device that receives one external power supply voltage and generates stable power supply voltages by utilizing a voltage level setting unit to control the power connection node voltage level and a voltage driving unit to drive the second power supply voltage terminal, allowing for efficient operation in both normal and test modes.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If test equipment supplies only one power supply voltage, then the number of devices that can be tested simultaneously increases, but the voltage level becomes unstable and testing time increases
Solution Approach 1:
A voltage level setting unit is introduced as an intermediary component between the single power supply voltage source and the semiconductor device. This unit adjusts the power supply voltage to an appropriate voltage level, ensuring stable operation while allowing test equipment to supply only one voltage, thereby enabling simultaneous testing of multiple devices without compromising voltage stability
Solution Approach 2:
The semiconductor device includes an internal voltage generation circuit that can generate the second power supply voltage internally when only one power supply voltage is provided externally. This self-service mechanism allows the device to maintain dual voltage operation for simultaneous testing while ensuring stable voltage levels through internal regulation
2Volume of moving object
If data transmission driver is used to supply power supply voltage, then device size is reduced, but current driving strength is insufficient and voltage level becomes unstable
Solution Approach 1:
The power supply function is segmented into multiple components: a compact data transmission driver for basic voltage supply, and a separate voltage level setting unit or internal voltage generation circuit for current amplification and voltage stabilization. This segmentation allows the driver to remain small while the voltage regulation system provides sufficient current driving strength
Solution Approach 2:
The power supply system uses a composite structure combining the data transmission driver with additional voltage regulation elements (voltage level setting unit or internal voltage generation circuit). This composite approach maintains the size advantage of the small driver while adding the current driving capability needed for stable voltage supply
3Use of energy by moving object
If voltage down converting scheme is used to generate second power supply voltage, then current consumption increases, but the scheme enables internal voltage generation
Solution Approach 1:
The voltage down converting scheme is optimized by adjusting its operating parameters to reduce current consumption. The voltage level setting unit or internal voltage generation circuit is designed to convert the first power supply voltage to the second power supply voltage with improved efficiency, maintaining the adaptability of internal voltage generation while minimizing energy loss
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution enables the semiconductor device to perform test operations as if two external power supply voltages are received, increasing the number of devices that can be tested simultaneously, reducing manufacturing costs, and accommodating variable internal power supplies while maintaining stability and efficiency.
Implementation Method 1
a voltage level setting unit configured to control a voltage level of a power connection node
Implementation Method 2
a voltage driving unit configured to drive a second power supply voltage terminal with the first power supply voltage
Data Source
AI summary
A semiconductor device and a power voltage supply circuit for a test operation of a semiconductor system including the semiconductor device. The semiconductor device receives first and second power supply voltages in a normal operation mode from an external device and receives the first power supply voltage in a test operation mode. The semiconductor device includes a voltage level setting unit configured to set a power connection node at a voltage between a voltage level of a first power supply voltage terminal and a voltage level of a ground voltage terminal according to an operation mode signal, and a voltage driving unit configured to drive a second power supply voltage terminal with the first power supply voltage in the test operation mode, wherein the driving power is controlled according to the voltage level of the power connection node.