Semiconductor Test Circuit with Pump Holding Signal
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Solution Overview
Problem
Conventional semiconductor device voltage measurement methods struggle to precisely analyze voltages during specific operation sections due to changes over time, making it difficult to measure desired voltages accurately.
Innovation Solution
A semiconductor device with a control circuit that stores a breaking address for a measurement section, generates a pump holding signal to maintain a uniform clock signal, and uses a pump unit to produce output voltages, allowing for precise measurement of voltages during desired sections by comparing count addresses and holding operations when they match the stored address.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional voltage measurement methods are used, then the entire operation including the desired section is performed, but it is difficult to precisely analyze the desired section because all voltages must be analyzed after the entire operation
Solution Approach 1:
The patent applies preliminary action by pre-storing the breaking address in the control circuit before the operation begins. This allows the system to prepare the measurement parameters in advance, so when the operation reaches the desired section, the measurement can be immediately triggered without needing to analyze all voltages after the entire operation completes. The program counter is also prepared to generate the count address that will be compared against the stored breaking address.
Solution Approach 2:
The patent implements feedback through the comparison mechanism between the count address (generated during operation) and the breaking address (stored beforehand). When these addresses match, the control circuit receives feedback and triggers the pump holding signal to maintain the voltage at that specific moment. This feedback loop enables precise identification and measurement of voltages at the desired section without requiring post-operation analysis of all voltages.
2Productivity
If the pump circuit generates high voltages according to clock signals during operation, then the voltages change over time according to operation characteristics, but it becomes difficult to measure voltages at specific desired sections
Solution Approach 1:
The feedback mechanism compares the count address generated during high-speed operation with the pre-stored breaking address. When they match, the control circuit immediately triggers the pump holding signal to maintain the voltage. This real-time feedback enables precise voltage measurement at the desired section even while the pump circuit operates at high speed, without requiring slow post-operation analysis.
Solution Approach 2:
The patent changes the state parameter of the pump circuit by introducing the pump holding signal that maintains the clock signal and voltage at a specific level when the address match occurs. This parameter change allows the voltage to be held steady for measurement purposes while the rest of the system continues to operate normally, enabling accurate measurement without disrupting the overall operation speed.
3Reliability
If all voltages are measured and analyzed after the entire operation, then complete operation data is obtained, but precise analysis of the desired section is difficult due to time changes
Solution Approach 1:
The patent extracts the voltage measurement at the specific desired section from the entire operation sequence by using the address comparison mechanism. When the count address matches the stored breaking address, only the voltage at that specific moment is extracted and maintained for measurement. This extraction approach maintains operation completeness while enabling precise section analysis by isolating the specific voltage data point from the entire operation.
Solution Approach 2:
By preliminarily storing the breaking address that identifies the desired section, the system prepares in advance which voltage measurement is needed. This preliminary action allows the system to focus measurement resources on the specific section of interest rather than attempting to analyze all voltages after operation, thereby achieving both complete operation execution and precise section analysis.
Data Source
AI summary
A semiconductor device having a test function includes a program counter for storing a breaking address in a storage unit in response to control signals, increasing a count address in response to the control signals, and storing the increased count address in the storage unit; a controller for stopping the increase of the count address when the count address is identical to the breaking address and outputting a pump holding signal; an oscillator for generating a clock signal in response to an enable signal and maintaining a current cycle of the clock signal in response to the pump holding signal; and a pump unit for generating an output voltage in response to the clock signal.