Semiconductor Test Sub Route Flow Configuration
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Solution Overview
Problem
In semiconductor product testing, manual creation of experimental route flows is time-consuming, error-prone, and inefficient, leading to increased complexity and reduced work efficiency due to the need for manual data input and the risk of incorrect parameter settings affecting test results.
Innovation Solution
A method and apparatus for configuring a sub route flow that involves determining test items, obtaining and adjusting preset test parameters, and forming a sub route flow based on current test parameters, reducing manual input and optimizing parameter settings through automated processes.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If manual creation of experimental route flows is used, then flexibility in engineering experiments is maintained, but time consumption and error rate increase significantly
Solution Approach 1:
The system pre-configures standard route flow templates with commonly used test items and parameters. When creating a new experimental route flow, the system automatically retrieves and applies these pre-configured templates, eliminating the need for manual creation of routine components while preserving flexibility through selective modification of template parameters.
Solution Approach 2:
The system enables copying of existing route flow configurations and test item settings across different experimental scenarios. Users can replicate proven test configurations and modify them for new experiments, significantly reducing repetitive manual input while maintaining the ability to adapt to different experimental requirements.
2Adaptability or versatility
If manual data input is used for test parameters, then customization is possible, but error rate and complexity increase
Solution Approach 1:
The system automatically retrieves test parameters from databases and configuration files based on selected test items, eliminating the need for manual parameter input. The system self-configures parameter values, units, and relationships by matching selected test items with stored configuration data, reducing errors while preserving customization through selective parameter override.
Solution Approach 2:
The system introduces an intermediate configuration layer between test item selection and actual test execution. This intermediary layer automatically processes parameter mappings, validates parameter combinations, and resolves dependencies, simplifying the configuration process while maintaining full customization capability through the interface.
3Manufacturing precision
If manual configuration of route flows is performed, then detailed control is achieved, but work efficiency decreases
Solution Approach 1:
The system pre-validates and pre-configures test parameters and route flow structures according to established testing standards and requirements. This preliminary configuration ensures precision and compliance while eliminating manual verification steps, significantly improving work efficiency without sacrificing configuration accuracy.
Solution Approach 2:
The system provides automated feedback during the configuration process, including validation of parameter combinations, detection of missing required parameters, and suggestions for optimal test item selections. This feedback mechanism maintains high configuration precision by catching errors early while improving efficiency by guiding users through the configuration process.
Data Source
AI summary
A sub route flow is a route flow different from a main route flow in testing of a semiconductor product. A method for configuring a sub route flow includes: determining at least one test item of the semiconductor product; obtaining a first test template corresponding to the test item, wherein the first test template includes preset test parameters; displaying the preset test parameters; receiving test parameters adjusted according to the preset test parameters; configuring current test parameters of the test item according to the adjusted test parameters; and forming the sub route flow of the semiconductor product according to the current test parameters of the test item.