High-Power Semiconductor Testing via Voltage-Time Balancing
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Solution Overview
Problem
High-current testing of high-performance semiconductor elements for HVDC transmission systems poses challenges due to transformer saturation, leading to component damage and restricted test frequency compatibility with mains frequency.
Innovation Solution
A method involving voltage-controlled power converter modules that switch to an undefined state during test cycles, balancing the voltage-time area to prevent transformer saturation, allowing for efficient high-current testing across a wide frequency range.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Power
If voltage-controlled power converter modules are used for high-current testing, then high-voltage testing capability is achieved, but transformer saturation occurs leading to component damage
Solution Approach 1:
The patent applies periodic action by switching the voltage-controlled power converter modules to an undefined state in periodic intervals during the test cycle. This periodic switching prevents cumulative voltage-time area buildup that would cause transformer saturation, thereby enabling high-power testing while maintaining component reliability and preventing damage.
2Device complexity
If synthetic test circuits with resonant circuits are used, then test equipment size is reduced, but test frequency is restricted to mains frequency
Solution Approach 1:
The patent employs dynamics by making the test circuit frequency-adaptive through the voltage-controlled power converter modules. These modules can dynamically adjust their operating frequency to match different test requirements (50 Hz or 60 Hz networks), unlike fixed-frequency resonant circuits. This dynamic capability maintains compact equipment size while achieving frequency versatility.
3Reliability
If back-to-back testing is performed for high-power semiconductor elements, then comprehensive performance testing is achieved, but test equipment size becomes very large
Solution Approach 1:
The patent extracts the high-voltage generation function from the traditional back-to-back test system and implements it separately using voltage-controlled power converter modules. This extraction allows the test circuit to achieve comprehensive high-power testing capability while maintaining a compact size, as only the essential high-voltage generation components are included rather than a complete back-to-back converter system.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach extends the service life of components by preventing transformer saturation, enabling high-voltage testing with minimal network impact and flexible current adjustment, ensuring compatibility with various operating frequencies.
Implementation Method 1
a high-current transformer with a primary side and a secondary side
Implementation Method 2
extremely high current values occur on the primary side of the transformer. Under certain circumstances, this can lead to damage to the components involved
Data Source
Figure 1
Figure 2
Figure 3~4
AI summary
A method for testing a high-power semiconductor element (11) of power converters of the high-voltage direct current transmission by means of a test circuit (20) comprising a number of voltage-regulated power converter modules (16) switched in series which can be connected to the primary side of a high-current transformer (9) and in which the secondary side of the high-current transformer (9) can be connected to the high-power semiconductor element (1), should enable a high-current test of a high-power semiconductor element by means of a described test circuit at a particularly high service life of the components used. For this purpose, the voltage-regulated power converter modules (16) are switched in a temporal phase of a test cycle into an undefined state.