Semiconductor Tool Weight Placement for Low-Frequency Vibration

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Solution Overview

Problem

Low frequency vibrations in semiconductor manufacturing facilities affect production tools, leading to reduced production yield rates due to defects such as pits, bumps, and line defects caused by equipment shaking during processes like thin film deposition.

Innovation Solution

Attaching weights or masses to semiconductor manufacturing apparatus to increase its mass, thereby reducing susceptibility to vibrations, using materials like metal blocks or plates, and employing damping materials to secure the weights and limit vibration transmission.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If weights are attached to semiconductor manufacturing apparatus to reduce vibration, then manufacturing precision is improved, but device complexity increases

Engineering Contradiction:
Improvemanufacturing precisionVSAvoiddevice complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The vibration reduction system is segmented into multiple independent weights that can be attached to different locations on the apparatus. Each weight addresses specific vibration frequencies or locations, allowing the system to be divided into manageable components rather than requiring a single complex vibration reduction mechanism.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent transitions from addressing vibration in a single dimension to multi-dimensional vibration control by attaching weights at various locations around the apparatus. This spatial distribution of weights creates a comprehensive vibration reduction system that addresses vibrations from multiple directions and frequencies simultaneously.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Manufacturing precision

If damping materials are used to secure weights and limit vibration transmission, then manufacturing precision is improved, but loss of energy increases

Engineering Contradiction:
Improvemanufacturing precisionVSAvoidloss of energy
Core Design Contradiction:
Manufacturing precisionVSLoss of energy

Solution Approach 1:

Damping materials are pre-installed between the weights and the apparatus structure to cushion against vibration transmission before the vibration occurs. This beforehand cushioning prevents vibration energy from transmitting to the apparatus, protecting the manufacturing process from vibration-induced defects while managing energy dissipation.

Inventive Principle:
Principle #11Beforehand cushioning (Prior cushioning)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The added weights significantly reduce vibrations, enhancing equipment stability and minimizing defects in semiconductor devices, allowing for improved manufacturing precision and yield.

Implementation Method 1

Attaching weights or masses to semiconductor manufacturing apparatus to increase its mass, thereby reducing susceptibility to vibrations

Methodology Applied
Scientific EffectInertia: Inertia

Implementation Method 2

employing damping materials to secure the weights and limit vibration transmission

Methodology Applied
Scientific EffectDamping: Damping

Data Source

PatentUS20240247700A1Methods for reducing vibration of semiconductor manufacturing apparatuses and semiconductor manufacturing apparatuses
Publication Date: 2024.07.25 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US20240247700A1 patent drawing
  • US20240247700A1 patent drawing
  • US20240247700A1 patent drawing

AI summary

A method that includes measuring vibration levels in a semiconductor manufacturing apparatus, determining one or more sections of the semiconductor manufacturing apparatus that vibrate at levels greater than a predetermined vibration level, and reducing the vibration levels in the one or more sections to be at or within the predetermined vibration level by coupling one or more weights to an external surface of the semiconductor manufacturing apparatus in the one or more sections.