Semiconductor Trench Etching Scallop Control
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Solution Overview
Problem
The Bosch process for forming deep openings in semiconductor substrates results in scalloping on the side surfaces of the openings, which complicates the formation of vertical trenches and can lead to voids and cracks during the filling of insulation films, affecting the embedding characteristics and manufacturing yield.
Innovation Solution
A method involving a series of etching and deposition cycles with controlled etching times and bias powers to form a tapered portion with scallop-forming trenches and a vertical portion with substantially vertical sidewalls, where the width of the scallop-forming trench in the tapered portion is larger than in the vertical portion, allowing for a smooth transition and preventing voids during insulation film filling.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Shape
If the Bosch process is used to form deep openings with vertical shapes, then the opening depth and vertical shape are improved, but scalloping is formed on the side surface of the opening
Solution Approach 1:
The opening formation process is divided into multiple cycles, each cycle creating a portion of the final opening. By segmenting the etching into repeated isotropic and anisotropic steps with protective film deposition in between, the process achieves both depth and vertical shape while managing scalloping through controlled cycles
Solution Approach 2:
The Bosch process uses periodic repetition of etching and protective film deposition cycles. Each cycle consists of isotropic etching followed by protective film formation, then anisotropic etching to remove the film from the bottom. This periodic action allows the opening to be deepened progressively while maintaining vertical walls and controlling scalloping
2Length of stationary object
If repeated etching and deposition cycles are performed to form deep openings, then the opening depth is improved, but the process complexity increases
Solution Approach 1:
The process uses periodic repetition of standardized etching and deposition cycles to achieve great opening depths. Each cycle follows the same pattern: isotropic etching, protective film deposition, and anisotropic etching. This periodic approach systematically increases depth while maintaining process control and reducing overall complexity through repetition of proven steps
Solution Approach 2:
Protective film is deposited in advance on the side surfaces before the anisotropic etching step. This preliminary protective action prevents unwanted etching of the sides during the anisotropic phase, allowing the process to safely repeat cycles to achieve greater depths without compromising structural integrity
3Reliability
If scalloping is formed on the side surface of the opening, then the embedding characteristics of insulation films deteriorate, but voids and cracks may occur during filling
Solution Approach 1:
The opening structure is designed with different local characteristics: the upper portion has a wider opening to accommodate the mask pattern and provide access, while the lower portion maintains a narrower, more uniform width for better insulation film embedding. This local differentiation of dimensions optimizes both filling access and embedding quality, reducing voids and cracks
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables the formation of trenches with a wide opening and substantially vertical sidewalls, improving the embedding characteristics of insulation films and reducing the risk of voids and cracks, thus enhancing the manufacturing process and product reliability.
Implementation Method 1
a first opening 31-1 is formed by dry etching having high isotropy
Implementation Method 2
the dry etching in which the anisotropy is increased by using the etching gas is performed
Implementation Method 3
a deposition process of depositing a carbon polymer-based protective film on an inner wall of the opening alternately
Data Source
AI summary
A semiconductor device comprises a material layer including a first surface and a trench with an opening in the first surface. The trench is formed in the material layer. The trench comprises a tapered portion and a vertical portion. The tapered portion is in contact with the opening and comprises a scalloping-forming trench. The vertical portion has a substantially vertical sidewall. A width of the scalloping-forming trench is larger than a width of the vertical portion.


