Semiconductor Trimming Control Circuit Using Fuse Signal Selection
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Solution Overview
Problem
The existing trimming functions in semiconductor devices require specialized devices for evaluation, leading to unstable operations and the need for multiple semiconductor chips for adjustments, as they rely on fuses that are difficult to restore and require laser repair, which is time-consuming and impractical without a repairing apparatus.
Innovation Solution
A semiconductor device with a circuit configuration that uses a control circuit and selector circuit to adjust the trimming function based on external test signals, allowing for stable operation without cutting off the fuse, using internal power sources to generate control signals and selecting between fuse and control signals based on the power source stability.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a fuse is used for trimming adjustment, then the trimming function can be implemented, but the evaluation requires specialized laser repair apparatus and multiple semiconductor chips
Solution Approach 1:
The patent creates a virtual copy of the fuse trimming function through software control. Instead of physically cutting fuses with laser repair, the system uses a control circuit to simulate fuse states (cut or uncut) by generating appropriate control signals. This software-based copy eliminates the need for specialized laser repair apparatus and allows multiple evaluations on a single chip.
Solution Approach 2:
The patent replaces the mechanical laser repair process with an electronic control system. The physical act of cutting a fuse with a laser beam is substituted by an electronic control circuit that can programmatically set fuse states. This substitution transforms a mechanical/optical process into an electronic one, enabling easier operation and evaluation.
2Manufacturing precision
If laser repair is used to cut the fuse, then the trimming adjustment can be made, but the process is time-consuming and requires specialized apparatus
Solution Approach 1:
The patent performs preliminary actions by pre-configuring the control circuit to simulate various fuse states. Instead of waiting for laser repair to cut fuses during evaluation, the system can immediately switch between different fuse configurations through control signals. This preliminary preparation of control mechanisms eliminates the time-consuming laser repair process.
Solution Approach 2:
The patent changes the operational parameter from physical fuse state (cut or uncut) to controllable electrical signal state. By changing how the fuse state is represented and manipulated (from physical modification to electrical control), the system achieves the same trimming function without the time penalty of laser repair.
3Manufacturing precision
If the fuse is cut off for trimming, then the circuit adjustment is permanent, but restoration is not possible and multiple chips are needed for re-evaluation
Solution Approach 1:
The patent transforms the static, permanent fuse state into a dynamic, changeable state. Instead of a fuse that remains cut or uncut permanently, the control circuit can dynamically switch between different fuse configurations on demand. This dynamic capability allows the same circuit to be re-evaluated multiple times without physical restoration, as the control signals can reset and reconfigure the fuse states.
Solution Approach 2:
The control circuit provides self-service functionality by automatically managing fuse states without external laser repair apparatus. The system can independently reset and reconfigure fuse configurations through its control signals, eliminating the need for specialized repair equipment and enabling easy re-evaluation on the same chip.
4Reliability
If multiple semiconductor chips are used for trimming evaluation, then the evaluation can be performed, but the quantity of chips required increases
Solution Approach 1:
The patent makes a single semiconductor chip universal for multiple evaluation scenarios. By incorporating the control circuit that can simulate different fuse states, one chip can perform the function of multiple chips that would otherwise be needed for different trim configurations. The same physical chip can be evaluated under various fuse conditions by simply changing control signals, not by using different chips.
Data Source
AI summary
A semiconductor device includes a circuit-to-be-adjusted in which an output characteristic thereof can be adjusted by a fuse that is controlled based on a fuse signal. The semiconductor device includes a control circuit using, as a power source, an internal power source that has a converted voltage obtained by converting a voltage of an external power source, the control circuit being configured to generate control signals A, B based on an inputted test signal, the control signals being able to adjust the circuit-to-be-adjusted in place of the fuse signal. The semiconductor device includes a selector circuit that selects the fuse signal before the internal power source reaches a stable state after the external power source is turned on, and selects the control signal CS after the internal power source has reached a stable state.