Semiconductor Voltage Allocation via Dynamic Switching

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Solution Overview

Problem

Existing semiconductor devices face challenges in allocating the most suitable internal voltage generating circuits and load circuits due to manufacturing variations, leading to difficulties in meeting examination test standards, reduced product yield, and increased manufacturing costs.

Innovation Solution

A semiconductor device with multiple internal voltage generating circuits and load circuits is equipped with a switching circuit and control circuit that allows for dynamic switching between different voltage generating circuits and load circuits based on test mode signals, determining optimal connections to meet specific performance standards.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If switching control is performed according to function mode regardless of circuit characteristics, then operation mode switching is achieved, but optimal allocation of voltage generating circuits to load circuits cannot be realized

Engineering Contradiction:

Improveallocation adaptabilityVSAvoidswitching control complexity

Core Design Contradiction:

Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The patent applies preliminary action by performing examination tests before normal operation to determine the optimal correspondence between internal voltage generating circuits and load circuits. The control circuit stores the test results and uses them to pre-establish the optimal allocation, avoiding the need for complex real-time switching control based on circuit characteristics during operation.

Inventive Principle:

Principle #10Preliminary action

2Adaptability or versatility

If multiple internal voltage generating circuits are provided for different function modes, then functional requirements are met, but difficulty in allocating the most suitable circuit increases

Engineering Contradiction:

Improvefunctional adaptabilityVSAvoidcircuit characteristic matching difficulty

Core Design Contradiction:

Adaptability or versatilityVSDifficulty of detecting and measuring

Solution Approach 1:

The patent applies feedback by using the results from examination tests to inform the allocation decision. The control circuit receives test results feedback about the characteristics of each voltage generating circuit and load circuit, then uses this feedback to determine the optimal correspondence, ensuring both functional requirements and characteristic matching are satisfied.

Inventive Principle:

Principle #23Feedback

Solution Approach 2:

The patent applies parameter changes by varying the allocation configuration of voltage generating circuits to load circuits based on test results. Different correspondence relationships are tested and selected by changing the connection parameters, allowing the system to find the optimal match between circuits with different characteristics.

Inventive Principle:

Principle #35Parameter changes

3Productivity

If switching control is implemented without considering individual device characteristics, then manufacturing process variations are not compensated, but product yield decreases

Engineering Contradiction:

Improveproduct yieldVSAvoidcircuit characteristic consistency

Core Design Contradiction:

ProductivityVSManufacturing precision

Solution Approach 1:

The patent applies local quality by allowing each semiconductor device to have a customized allocation of voltage generating circuits to load circuits based on its specific characteristics. Instead of using a uniform allocation for all devices, the system determines the optimal local configuration for each device through examination tests, compensating for manufacturing variations and improving yield.

Inventive Principle:

Principle #3Local quality

4Ease of manufacture

If examination tests are performed with fixed circuit allocations, then testing is simplified, but optimal circuit allocation cannot be determined

Engineering Contradiction:

Improvetesting simplicityVSAvoidoptimal allocation capability

Core Design Contradiction:

Ease of manufactureVSAdaptability or versatility

Solution Approach 1:

The patent applies dynamics by making the circuit allocation configurable and changeable during examination tests. The switching circuit allows different allocation configurations to be tested dynamically, and the control circuit selects the optimal configuration based on test results. This dynamic approach maintains testing simplicity while enabling optimal allocation determination.

Inventive Principle:

Principle #15Dynamics

Data Source

PatentUS8130565B2Semiconductor device

Publication Date: 2012.03.06 MICRON TECHNOLOGY INC

AI summary

A semiconductor device includes internal voltage generating circuits, a switching circuit, load circuits, a control circuit. Each of the plurality of load circuits is supplied with voltage through the switching circuit from any one of the plurality of internal voltage generating circuits. The control circuit defines connecting combinations by the switch circuit. The control circuit supplies a control signal to the switch circuit, based on the control signal corresponding to the definitions of the connecting combinations. The control circuit allows switching the connecting combinations when the semiconductor device tests in a test mode. The control circuit prohibits switching the connecting combinations in a non-test mode. The switch circuit connects between each of m of the internal voltage generating circuits and each of n of the load circuits through a connecting combination which is selected, based on the control signal, from mn of the connecting combinations.