Semiconductor Voltage Control via Dynamic Trimming Code Switching
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Solution Overview
Problem
Existing semiconductor apparatuses face difficulties in varying the internal voltage level during tests when the trimming code is fixed, making it challenging to adjust voltage levels for specific operations.
Innovation Solution
A semiconductor apparatus with an internal voltage level controller that outputs either a normal trimming code or a test voltage code in response to test mode signals, allowing the internal voltage generator to adjust the voltage level accordingly, enabling voltage level control during tests and normal operations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Stability of the object's composition
If a fuse circuit is used to fix the trimming code, then the voltage level stability is improved, but the adaptability to vary voltage level during testing deteriorates
Solution Approach 1:
The patent implements a dynamic code selection mechanism that allows the trimming code to switch between fixed (normal operation) and variable (test operation) states. The internal voltage level controller selects between a first trimming code stored in fuse circuit and a second trimming code provided externally, enabling the voltage level to adapt dynamically based on operational mode while maintaining stability during normal operation.
2Manufacturing precision
If the trimming code is fixed, then the manufacturing precision is improved, but the ease of operation during testing deteriorates
Solution Approach 1:
The patent introduces an internal voltage level controller as an intermediary component that mediates between the fixed fuse circuit storage and the variable voltage requirements. This controller accepts trimming codes from either the fuse circuit or external sources, and generates corresponding internal voltages, thereby enabling easy voltage adjustment during testing without compromising the precision established by the fuse circuit.
3Device complexity
If the internal voltage level is determined by trimming code, then the device complexity is reduced, but the productivity during testing deteriorates
Solution Approach 1:
The patent implements a universal voltage control system where the internal voltage level controller serves multiple functions: it operates with fixed trimming codes from fuse circuit during normal production, accepts variable external codes during testing, and maintains consistent voltage generation functionality throughout. This multi-functionality enables efficient test operations without increasing overall device complexity.
Data Source
AI summary
A semiconductor apparatus may include an internal voltage level controller configured to output either a normal trimming code or a test voltage code as a voltage control code in response to a test mode signal, a specific operation start signal, and a specific operation end signal. The semiconductor apparatus may include an internal voltage generator configured to generate an internal voltage and control a voltage level of the internal voltage in response to the voltage control code.