Semiconductor Internal Voltage Trimming Automation
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Solution Overview
Problem
Conventional methods for trimming internal voltages in semiconductor apparatuses are time-consuming due to the need for manual adjustment and monitoring of test codes by external test apparatuses.
Innovation Solution
A semiconductor apparatus with an internal voltage generation unit, voltage comparison unit, and voltage control code generation unit that automatically adjusts the voltage control code based on comparison results, allowing for rapid trimming of internal voltages.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Extent of automation
If a test apparatus manually adjusts and monitors test codes to trim internal voltage, then voltage trimming can be performed, but the testing takes a significant amount of time
Solution Approach 1:
The semiconductor apparatus automatically trims its own internal voltage by comparing the internal voltage with a target voltage and self-adjusting the voltage control code without requiring external test apparatus intervention. The trimming operation is performed autonomously within the semiconductor apparatus, eliminating the time-consuming manual adjustment process.
Solution Approach 2:
The invention implements a feedback mechanism where the internal voltage is continuously monitored and compared with the target voltage, and the voltage control code is adjusted based on the comparison result. This closed-loop feedback system enables automatic voltage trimming without manual intervention, significantly reducing testing time.
2Ease of operation
If external test apparatus individually adjusts and inputs test codes, then voltage trimming can be achieved, but the process becomes complex and time-consuming
Solution Approach 1:
The semiconductor apparatus performs voltage trimming autonomously without requiring external test apparatus. The apparatus compares its internal voltage with a target voltage and automatically adjusts the voltage control code, simplifying the operation to merely providing the target voltage while eliminating complex manual adjustment procedures.
Solution Approach 2:
The invention extracts the voltage trimming function from the external test apparatus and relocates it within the semiconductor apparatus itself. By integrating the voltage comparison and control code adjustment functions inside the apparatus, the complex external testing process is eliminated, leaving only simple target voltage input required.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The semiconductor apparatus reduces the time required for internal voltage trimming and can automatically perform the operation, enabling quicker determination of optimal voltage control codes.
Implementation Method 1
a charge pumping unit configured to generate an internal voltage by performing a charge pumping based on a result of comparison between a reference voltage and a feedback voltage
Implementation Method 2
a voltage comparison unit configured to compare a voltage level of a target voltage with a voltage level of the internal voltage
Implementation Method 3
a voltage division unit configured to divide a voltage of the internal voltage terminal and output the feedback voltage having a voltage level corresponding to a code value of a voltage control code
Data Source
AI summary
Various embodiments of a semiconductor apparatus are disclosed. In one exemplary embodiment, the semiconductor apparatus may include an internal voltage generation unit configured to generate an internal voltage having a voltage level corresponding to a code value of a voltage control code, a voltage comparison unit configured to compare a voltage level of a target voltage with a voltage level of the internal voltage, and a voltage control code generation unit configured to adjust the code value of the voltage control code based on the comparison result of the voltage comparison unit.