Semiconductor Device Word Line Detection Circuit
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Solution Overview
Problem
Existing semiconductor memory devices face challenges in detecting whether a burn-in test operation is normal, leading to increased testing times and costs due to the need for stress application across multiple regions as capacitance increases.
Innovation Solution
A semiconductor device with a detection circuit between word lines and a decoder that raises and monitors the word lines during a test operation, allowing for the detection of abnormality in the burn-in process by ensuring the rising state of the word lines is normal.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If multiple word lines are simultaneously selected and stress is applied during burn-in test, then the testing coverage is improved, but the testing time increases
Solution Approach 1:
The patent applies preliminary action by performing a quick detection test before the full burn-in test. The detection circuit checks whether word lines can be normally raised during a test operation, identifying obviously defective devices early. This preliminary screening allows the system to avoid time-consuming full burn-in tests on devices that will ultimately fail, thus reducing overall testing time while maintaining reliability.
2Reliability
If multiple word lines are simultaneously selected and stress is applied during burn-in test, then the testing coverage is improved, but the testing cost increases
Solution Approach 1:
The detection circuit provides a low-cost preliminary screening mechanism that identifies defective devices before they undergo expensive full burn-in testing. By filtering out obviously defective devices early using simple detection logic, the system reduces the number of devices that require costly comprehensive stress testing, thereby lowering overall testing costs while maintaining adequate testing coverage.
3Measurement precision
If a detection circuit is added to monitor word line rising state, then the ability to detect abnormal test operation is improved, but the device complexity increases
Solution Approach 1:
The detection circuit acts as an intermediary between the word lines and the external testing system. It monitors the rising state of word lines during test operations and generates detection signals that indicate whether the test is proceeding normally. This intermediary component provides precise abnormal operation detection while maintaining relatively simple circuit structure, as it only needs to monitor voltage transitions and generate basic status signals rather than implement complex analysis functions.
Data Source
AI summary
A semiconductor device capable of detecting whether test operation is normal is provided. The semiconductor device includes a plurality of memory cells arranged in a matrix, a plurality of word lines provided corresponding to each of the rows of the plurality of memory cells respectively, a decoder for generating driving signals for driving the plurality of word lines, and a detection circuit provided between the plurality of word lines and the decoder for simultaneously raising the plurality of word lines by test operation and detecting whether or not the rising state of the plurality of word lines is normal.