Semiconductor I/O Feedback for Write Training Without Read Training
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Solution Overview
Problem
Existing semiconductor memory devices require read training before write training, leading to signal distortion due to additional circuits, and necessitate a read operation to check data accuracy, which complicates the write training process.
Innovation Solution
A semiconductor device performs asynchronous write training without read training by using an input/output interface with data input/output pins and a write clock signal pin to feed back result values to the memory controller, allowing write training to be conducted independently.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If read training is performed before write training to check data accuracy, then data writing reliability is improved, but training time and process complexity increase
Solution Approach 1:
The patent extracts the write training process from the conventional sequence that requires read training, enabling write training to be performed independently. The memory device samples write training data using write clock signals and directly outputs result values to the memory controller without requiring a preceding read operation, thus removing the time-consuming read training step while maintaining write reliability.
Solution Approach 2:
The patent implements a feedback mechanism where the memory device samples write training data with write clock signals, determines whether sampling is successful, and outputs result values back to the memory controller. This feedback loop enables the memory controller to adjust write timing based on actual sampling results, ensuring reliable data writing without requiring read training.
2Measurement precision
If additional circuits (matching delay units and buffers) are added to compensate for write clock tree delay, then data timing accuracy is improved, but signal distortion increases
Solution Approach 1:
The patent replaces the conventional approach of using physical matching delay units and buffers with a sampling-based timing detection mechanism. The memory device samples write training data using write clock signals and determines timing accuracy through sampling results rather than through additional delay circuits, thereby avoiding signal distortion while maintaining timing precision.
Solution Approach 2:
The memory device performs self-testing by sampling its own received write training data using its internal write clock signals. This self-service approach eliminates the need for external matching delay units and buffers, reducing circuit complexity and signal distortion while maintaining the ability to accurately measure and compensate for timing delays.
3Device complexity
If write training is performed without read training, then training process complexity is reduced, but data accuracy verification becomes difficult
Solution Approach 1:
The patent implements a feedback mechanism where the memory device samples write training data using write clock signals, determines whether sampling is successful, and outputs result values back to the memory controller. This feedback loop enables the memory controller to verify data accuracy and adjust write timing based on actual sampling results, maintaining verification capability without requiring read training.
Solution Approach 2:
The patent uses write training data and sampling results as intermediaries to verify data accuracy. Instead of requiring read operations to verify write accuracy, the system uses the sampled write training data itself as the verification medium, outputting result values that indicate whether sampling was successful, thereby simplifying the process while maintaining accuracy verification.
Data Source
AI summary
A semiconductor device includes an input/output interface with a first data input/output pin, a plurality of second data input/output pins, and a write clock signal pin, which is configured to receive a write clock signal from a memory controller. The first data input/output pin is configured to receive write training data from the memory controller during a write training operation, and the plurality of second data input/output pins feed result values of the write training to the memory controller. This write training is performed by the semiconductor device using the write clock signal and the write training data.