Sense Amplifier Voltage Regulation for Bit Line Precharge Stability

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Solution Overview

Problem

The potential of bit lines in memory cells is excessively high due to varying distances from the sense amplifier, leading to unstable amplification and increased susceptibility to read errors from power supply noise.

Innovation Solution

A sense amplifier with a voltage regulator and transistors that control the potential of a first node based on the bit line potential, using an enable signal to manage the pull-down time and reduce the bit line potential during the precharge phase.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Length of moving object

If the bit line is connected to a memory cell close to the sense amplifier, then the bit line is shorter and the load is lighter, but the potential of the bit line becomes excessively high

Engineering Contradiction:
Improvebit line lengthVSAvoidbit line potential stability
Core Design Contradiction:
Length of moving objectVSReliability

Solution Approach 1:

The patent introduces a feedback mechanism where the potential of the bit line is monitored and used to control the pull-down transistor. When the bit line potential exceeds a threshold, the feedback signal activates the pull-down transistor to reduce the potential, creating a self-regulating system that prevents excessive voltage buildup.

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The patent dynamically changes the state of the pull-down transistor based on the bit line potential. By controlling the transistor's on/off state according to the potential threshold, the system adjusts the electrical parameters of the bit line in real-time to maintain stable operation and prevent read errors.

Inventive Principle:
Principle #35Parameter changes

2Length of stationary object

If the potential of the bit line is excessively high, then the bit line is closer to the sense amplifier, but the sense amplifier cannot respond quickly and read errors occur

Engineering Contradiction:
Improvebit line distance to sense amplifierVSAvoidamplification response speed
Core Design Contradiction:
Length of stationary objectVSSpeed

Solution Approach 1:

The patent applies preliminary action by activating the pull-down transistor before the bit line potential becomes excessively high. The feedback mechanism detects the potential threshold in advance and triggers the pull-down action proactively, preventing the potential from reaching levels that would cause slow response or read errors.

Inventive Principle:
Principle #10Preliminary action

3Device complexity

If the bit line potential is not controlled, then the structure is simpler, but power supply noise causes read errors

Engineering Contradiction:
Improvevoltage control structureVSAvoidpower supply noise impact
Core Design Contradiction:
Device complexityVSObject-affected harmful factors

Solution Approach 1:

The feedback mechanism provides continuous monitoring of the bit line potential and automatically adjusts the pull-down transistor state to counteract noise disturbances. This closed-loop control filters out the effects of power supply noise by maintaining the potential within a stable range, protecting against read errors without requiring complex noise filtering circuits.

Inventive Principle:
Principle #23Feedback

Data Source

PatentUS20260018197A1Sense amplifier, voltage control method, and memory
Publication Date: 2026.01.15 WUHAN XINXIN SEMICON MFG CO LTD
  • US20260018197A1 patent drawing
  • US20260018197A1 patent drawing
  • US20260018197A1 patent drawing

AI summary

The application discloses a sense amplifier, a voltage control method, and a memory. The sense amplifier includes a first transistor, a second transistor, and a voltage regulator, wherein through the voltage regulator, based on an enable signal and a potential of a bit line, a potential of a first node is pulled down, allowing the potential of the first node to be pulled down during a precharge phase, and further enabling the potential of the bit line to be reduced through the first transistor, thereby alleviating the technical problem of the bit line potential being excessively high during the precharge phase of a read operation.