Sense Amplifier Offset Compensation Using Diode-Connected PMOS

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Solution Overview

Problem

Semiconductor memory technologies face issues with read and write errors due to defects in sense amplifiers and environmental influences, leading to inaccurate data readout, which affects the performance of memory devices.

Innovation Solution

A sense amplifier design incorporating PMOS and NMOS transistors configured in specific modes for offset compensation, pre-amplification, and write-back stages, along with switch control units, to ensure accurate data readout by mitigating transistor mismatches and environmental influences.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If conventional sense amplifier design is used, then device complexity is reduced, but read and write errors occur due to transistor mismatches and environmental influences

Engineering Contradiction:
Improvedata readout accuracyVSAvoidsense amplifier structure
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The sense amplifier is divided into multiple operational stages: offset compensation stage, pre-amplification stage, and write-back stage. Each stage uses specific transistor configurations (diode connection mode for compensation, cross-coupled mode for amplification) to address different aspects of the readout process, thereby improving reliability without requiring a completely new architecture.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The offset compensation stage is executed before the main amplification process. By pre-compensating for transistor mismatches and environmental offsets in the offset compensation stage, the subsequent amplification stage operates on a more accurate baseline, reducing read and write errors without significantly increasing overall complexity.

Inventive Principle:
Principle #10Preliminary action

2Measurement precision

If offset compensation measures are implemented, then data readout accuracy is improved, but circuit complexity increases

Engineering Contradiction:
Improvedata readout accuracyVSAvoidsense amplifier circuit
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The offset compensation function is merged into the existing sense amplifier circuit by configuring transistors in diode connection mode during the offset compensation stage. This approach integrates compensation functionality without requiring separate dedicated compensation circuits, thereby improving measurement precision while minimizing the increase in circuit complexity.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The sense amplifier operates in periodic cycles, alternating between offset compensation stage, pre-amplification stage, and write-back stage. During the offset compensation stage, transistors are configured in diode connection mode; during amplification stages, they switch to cross-coupled mode. This periodic reconfiguration enables precise offset compensation and high-accuracy amplification without permanently increasing circuit complexity.

Inventive Principle:
Principle #19Periodic action

3Reliability

If transistor mismatches are not compensated, then device complexity is low, but read and write errors occur due to environmental influences

Engineering Contradiction:
Improvedata accuracyVSAvoidtransistor configuration
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The transistor operating parameters are dynamically changed based on the operational stage. During offset compensation, transistors are configured in diode connection mode with specific bias conditions; during amplification, they switch to cross-coupled mode with different bias conditions. These parameter changes enable the circuit to adapt to different functional requirements, improving data accuracy while managing complexity through controlled parameter variation rather than structural complexity.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS11862284B2Sense amplifier, memory and data readout method
Publication Date: 2024.01.02 CHANGXIN MEMORY TECH INC
  • US11862284B2 patent drawing
  • US11862284B2 patent drawing
  • US11862284B2 patent drawing

AI summary

The present disclosure provides a sense amplifier, a memory, and a data readout method, and relates to the field of semiconductor memory technologies. The sense amplifier includes a first PMOS transistor, a second PMOS transistor, a first NMOS transistor, a second NMOS transistor, a first switch, a second switch, a third switch, and a fourth switch. During the offset compensation stage of the sense amplifier, the switching states of the first switch to the fourth switch are controlled so that the first NMOS transistor and the second NMOS transistor are configured to be in a cross-coupled amplification mode, and the first PMOS transistor and the second PMOS transistor are configured to be in a diode connection mode. The present disclosure enables to realize the offset compensation of the sense amplifier and improves the correctness of data readout by the memory.