Sense Amplifier Latch Circuit for Low-Voltage Memory Read
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Solution Overview
Problem
Conventional sense amplifiers for non-volatile memory cells are not compatible with low supply voltages and have high current consumption, making them unsuitable for low-voltage devices and noise-immune operation.
Innovation Solution
A sense amplifier design with a latch circuit comprising P-channel control transistors and cascode transistors that reduce control signals to low voltages when reaching reference voltages, enabling efficient data signal supply and low current consumption, suitable for a wide range of supply voltages and noise immunity.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Use of energy by moving object
If conventional sense amplifiers are used to detect memory cell conductivity states, then data reading function is achieved, but current consumption is high and compatibility with low supply voltages is lost
Solution Approach 1:
The patent changes the operating parameters of the sense amplifier by using control transistors that reduce control signals to low voltages when reference voltages are reached. This allows the amplifier to operate correctly across a wide range of supply voltages including low-voltage conditions, while maintaining low current consumption through optimized transistor switching characteristics.
Solution Approach 2:
The sense amplifier employs dynamic control through cascode transistors and control transistors that automatically adjust their operation based on the detected voltage levels. The control transistors dynamically reduce control signals when reference voltages are reached, enabling the circuit to adapt its behavior to different supply voltage conditions and optimize current consumption accordingly.
2Reliability
If conventional sense amplifiers with high current consumption are used, then sufficient signal detection capability is achieved, but noise immunity deteriorates in low-voltage devices
Solution Approach 1:
The patent implements feedback mechanisms through the latch circuit and control transistors that monitor the detected signal levels and automatically adjust the control signals. This feedback ensures that the sense amplifier maintains optimal operating conditions for noise immunity while consuming minimal current, as the control transistors reduce their drive strength when sufficient detection is achieved.
3Adaptability or versatility
If control signals are reduced to low voltages when reference voltages are reached, then current consumption is minimized and low-voltage compatibility is achieved, but latch circuit activation complexity increases
Solution Approach 1:
The sense amplifier circuit performs self-service through its inherent latch mechanism and control transistor configuration. The control transistors automatically reduce control signals when reference voltages are reached, and the latch circuit self-activates based on the differential detection outcome, eliminating the need for external complex control logic and reducing overall system complexity despite the sophisticated voltage reduction mechanism.
Data Source
AI summary
A sense amplifier includes: two detection inputs, a latch circuit including two sections coupled to each other and each supplying a data signal. Each section is respectively powered by a P-channel control transistor, having a gate terminal receiving a control signal linked to a respective detection input of the two detection inputs. The sense amplifier includes a control circuit configured to reduce each of the control signals to a sufficiently low voltage to put the corresponding control transistor to the on state, when the control signal reaches a reference voltage. The latch circuit is activated to supply one of the data signals when a corresponding one of the control transistors is in the on state.