Sense Amplifier Testing with Shortened Duration for Memory Defect Detection
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Solution Overview
Problem
In the memory manufacturing process, abnormalities such as short circuits or contact failures can be difficult to detect due to the complex structure of memory products, affecting service life and product reliability, as they may not manifest under standard read and write conditions.
Innovation Solution
A method and device for testing memory units involve writing first and second data into a storage unit through a Sense Amplifier (SA), with the amplification duration of the SA being shortened during the writing of the second data, to exacerbate any existing abnormalities and facilitate detection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If standard read and write conditions are used for testing, then the testing process is simple and fast, but abnormalities such as short circuits or contact failures cannot be detected
Solution Approach 1:
The patent changes the testing parameters by shortening the amplification duration of the Sense Amplifier during the write operation. This parameter modification creates a more stringent testing condition that exposes abnormalities not detectable under standard conditions, thereby improving detection capability without significantly increasing testing complexity
Solution Approach 2:
The patent introduces dynamic control of the Sense Amplifier's amplification duration, making the testing process adaptive. By dynamically adjusting the amplification time to be shorter than normal, the system creates variable testing conditions that enhance the ability to detect manufacturing abnormalities while maintaining operational flexibility
2Measurement precision
If the amplification duration of the Sense Amplifier is shortened, then abnormalities are more easily detected, but the writing process becomes more difficult
Solution Approach 1:
The patent segments the write operation into two distinct phases: a normal write phase followed by a test write phase with shortened amplification duration. This segmentation allows the system to perform routine writes under normal conditions while dedicating specific test operations to detecting abnormalities, thereby maintaining ease of manufacture for normal operations while achieving high testing accuracy
Solution Approach 2:
The patent applies partial action by using the shortened amplification duration only during designated test operations rather than during all write operations. This selective application ensures that normal manufacturing and writing processes remain unaffected and easy to perform, while the excessive (shortened) amplification duration is applied specifically for enhanced detection during testing phases
Data Source
AI summary
A method and device for testing a memory and a method for simulated testing include operations as follows. First data is written into a to-be-tested storage unit through a Sense Amplifier (SA), second data different from the first data is written into the storage unit through the SA, and an amplification duration of the SA is shortened during the writing the second data, and data stored in the storage unit is read, and whether the storage unit is abnormal is determined according to the read data.