Sensor Alignment Verification Using Displacement Arrays

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Solution Overview

Problem

Existing sensor systems in vehicles, such as stereo cameras, are susceptible to misalignment due to environmental conditions such as vibrations and thermal shocks, leading to unreliable data interpretation, especially in autonomous vehicles.

Innovation Solution

An enhanced sensor alignment system using high fidelity displacement sensors to measure angular rotations and deviations under test conditions, providing precise alignment verification and feedback to ensure alignment within specified thresholds.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If sensor systems are used to collect data in vehicles, then the vehicle can detect objects and track velocity and direction, but the sensors become susceptible to misalignment due to environmental conditions such as vibrations and thermal shocks

Engineering Contradiction:
Improvedata reliabilityVSAvoidsensor alignment stability
Core Design Contradiction:
ReliabilityVSStability of the object's composition

Solution Approach 1:

The system performs preliminary alignment verification by measuring the relative positions of sensors before they are subjected to environmental conditions. Baseline measurements are established in advance, allowing the system to detect and correct misalignment issues before they affect data reliability during actual operation.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The system continuously monitors sensor alignment by measuring relative positions and comparing them against baseline data. When misalignment is detected, the system provides feedback to adjust sensor positions or correct measurement data, ensuring ongoing reliability despite environmental disturbances like vibrations and thermal shocks.

Inventive Principle:
Principle #23Feedback

2Measurement precision

If high fidelity displacement sensors are used to measure angular rotations and deviations, then alignment verification precision is improved, but system complexity increases

Engineering Contradiction:
Improvealignment measurement precisionVSAvoidalignment system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The system introduces displacement sensors as intermediary measurement devices that indirectly assess sensor alignment by measuring relative positions. This intermediary approach enables high-precision alignment verification without requiring direct complex measurement of angular rotations, simplifying the overall measurement system while maintaining accuracy.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The system replaces complex mechanical alignment measurement mechanisms with optical or electromagnetic displacement sensing. This substitution achieves high measurement precision for alignment verification while reducing mechanical complexity, as the displacement sensors can measure position changes without physical contact or complex mechanical linkages.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Data Source

PatentEP4185840B1Enhanced sensor alignment
Publication Date: 2025.12.17 VOLKSWAGEN GROUP OF AMERICA INVESTMENTS LLC
  • EP4185840B1 patent drawingFigure 1
  • EP4185840B1 patent drawingFigure 2A
  • EP4185840B1 patent drawingFigure 2B

AI summary

Devices, systems, and methods are provided for enhanced sensor alignment. A device may determine a first array of displacement sensors proximate to a first test structure. The device may determine a second array of displacement sensors proximate to a second test structure. The device may apply a test condition to the first array, the second array, the first test structure, and the second test structure. The device may collect a first output from applying the test condition to the first test structure. The device may collect a second output from applying the test condition to the second test structure. The device may generate a first deviation vector associated with the first output. The device may generate a second deviation vector associated with the second output. The device may determine a first design status of the first structure based on the first deviation vector. The device may determine a second design status of the second structure based on the second deviation vector.