Sensor Array Control Circuit Parallel Scanning FPGA
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Solution Overview
Problem
Conventional circuits for scanning arrays of pressure or force responsive sensor elements face limitations in accuracy and speed, leading to suboptimal data acquisition and transfer rates, which hinder real-time pressure or force mapping and sensitivity adjustments.
Innovation Solution
A control circuit with parallel modules and a field-programmable gate array (FPGA) architecture is used to enhance data acquisition rates, enable user-definable subset scanning, and automatically adjust gain and sensitivity, facilitating faster and more accurate data transfer and processing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If conventional circuits are used for scanning sensor arrays, then device complexity is reduced, but data acquisition rate and measurement precision deteriorate
Solution Approach 1:
The control circuit is divided into multiple parallel modules, each capable of independently scanning and processing signals from sensor elements. This segmentation enables simultaneous processing of multiple sensor signals, thereby increasing the overall data acquisition rate without requiring a single complex sequential circuit
Solution Approach 2:
The patent transitions from sequential scanning (one-dimensional time processing) to parallel scanning (two-dimensional space-time processing) by implementing multiple control modules that operate simultaneously on different sensor elements or groups, effectively adding a spatial dimension to the data acquisition process
2Measurement precision
If conventional scanning methods are used, then device complexity is minimized, but measurement precision and accuracy deteriorate
Solution Approach 1:
The control circuit incorporates feedback mechanisms where scanned signals are processed and used to adjust subsequent scanning operations or calibration parameters. This feedback loop enables real-time correction of measurement errors and improves overall measurement precision for pressure or force sensing
Solution Approach 2:
The system performs preliminary calibration actions by scanning sensor elements with known reference conditions before actual measurements. This preliminary calibration establishes baseline parameters that improve the accuracy of subsequent pressure or force measurements during normal operation
3Reliability
If full array scanning is performed, then complete data coverage is achieved, but scanning time increases
Solution Approach 1:
The control circuit enables partial scanning where only specific subsets or regions of the sensor array are scanned when full array coverage is not required. This partial action approach maintains data coverage for critical areas while significantly reducing the time required for scanning operations
Solution Approach 2:
The scanning system dynamically adjusts the scan pattern and coverage area based on real-time requirements. The control circuit can switch between scanning the entire array when complete coverage is needed and scanning only specific regions when speed is prioritized, making the scanning behavior adaptive to operational conditions
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution achieves significantly higher data acquisition and transfer rates, enabling real-time pressure or force mapping and improved sensitivity adjustments, thereby overcoming the limitations of conventional systems.
Implementation Method 1
the electrodes for at least one of the set of electrodes being covered with a variable resistance pressure or force sensitive material (e.g., an ink)
Data Source
AI summary
A control circuit for scanning a pressure or force responsive sensor array is disclosed. Pressure or force sensors formed of an array of pressure or force responsive sensor elements can be used to acquire pressure or force measurements in response to an applied load. The control circuit can sample signals from the sensor elements to detect the pressure or force at one or more sensor elements of the sensor array. The circuit herein may provide for relatively faster scan rates. A user may define a subset or subsets of sensor elements of the sensor array to be scanned. Various methods and related circuitry for adjusting for sensor characteristics are also disclosed.


