Sensor Array Flow Control for Sensitivity and Precision

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Solution Overview

Problem

Current sensors and sensor arrays for detecting viruses, bacteria, and chemicals are costly to produce and lack the ability to manipulate the morphology or flow of samples, resulting in low sensitivity and high rates of out-of-specification units, with existing roll-to-roll production processes prone to deviations from the centerline target.

Innovation Solution

A process that allows for real-time manipulation of the morphology or flow of samples over the sensor array surface, providing increased sensitivity and detection limits, with real-time notification of centerline deviations, enabling the production of large numbers of units with minimal defects without requiring large-scale clean rooms.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If roll-to-roll production process is used to make sensors and sensor arrays rapidly, then productivity is improved, but manufacturing precision deteriorates due to deviation from centerline target

Engineering Contradiction:
Improveproduction rateVSAvoidcenterline alignment
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The patent implements real-time feedback mechanisms that monitor the position of the drop or sample as it is applied to the sensor array surface. Sensors detect deviations from the centerline target and provide signals to actuators that adjust the positioning system dynamically during the roll-to-roll process, enabling continuous correction and maintaining manufacturing precision at high production rates

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The system employs dynamic positioning and manipulation capabilities that allow real-time adjustment of the drop or sample morphology and flow during the patterning process. This dynamic control enables the system to adapt to varying conditions and maintain precision even as production speed increases

Inventive Principle:
Principle #15Dynamics

2Ease of manufacture

If current sensor array manufacturing process is used, then ease of manufacture is improved, but measurement precision deteriorates due to inability to manipulate sample flow

Engineering Contradiction:
Improveprocess simplicityVSAvoiddetection sensitivity
Core Design Contradiction:
Ease of manufactureVSMeasurement precision

Solution Approach 1:

The patent incorporates dynamic manipulation of the drop or sample flow over the sensor array surface, allowing real-time control of sample morphology and distribution. This dynamic control optimizes sample delivery to sensor elements, significantly improving detection sensitivity and measurement precision while maintaining ease of manufacture through automated control

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The system changes physical parameters of the sample delivery process, such as drop velocity, spreading dynamics, and contact angle, to optimize sample distribution across the sensor array. These parameter adjustments enhance measurement precision without complicating the manufacturing process

Inventive Principle:
Principle #35Parameter changes

3Measurement precision

If real-time manipulation of sample morphology is implemented, then measurement precision is improved, but device complexity increases

Engineering Contradiction:
Improvedetection sensitivityVSAvoidprocess complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent introduces intermediary components such as specialized nozzles, capillary structures, or surface treatments that passively control sample flow and morphology. These intermediaries enable precise sample manipulation through their physical design rather than complex active control systems, improving measurement precision while limiting device complexity

Inventive Principle:
Principle #24Intermediary (Mediator)

Data Source

PatentUS20230045818A1Method of increasing sensitivity and limits of detection and controlling fluid flow over sensor and sensor array
Publication Date: 2023.02.16 THE GOVERNMENT OF THE UNITED STATES AS REPRESENTED BY THE SECRETARY OF THE AIR FORCE
  • US20230045818A1 patent drawing
  • US20230045818A1 patent drawing
  • US20230045818A1 patent drawing

AI summary

A process of making sensors and sensor arrays that has the ability to manipulate of the morphology or flow of an applied drop or sample over the sensor array surface at any point in the patterning process and sensors and sensor arrays having increased sensitivity and limits of detection. In addition, said process can provided real time notification of any centerline deviation. Such production process can be adjusted in real time. Thus, large numbers of units can be made—even in millions of per day—with few if any out of specification units being produced. Such process does not require large-scale clean rooms and is easily configurable.