Sensor Device Auxiliary Structure for Calibration
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Solution Overview
Problem
Sensor devices face challenges in achieving high measurement accuracy due to sensitivity to temperature changes, moisture, and mechanical stresses, and existing calibration methods using external magnetic fields are inaccurate and require frequent repositioning at different temperatures.
Innovation Solution
A sensor device with an electrically conductive chip carrier featuring a precalibration current terminal and a magnetic field sensor chip, where the shape of the chip carrier induces a predefined precalibration magnetic field at the sensor element during calibration, allowing for accurate calibration without external magnetic sources, and the chip carrier is partly encapsulated to account for mechanical stresses.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If external magnetic fields are used for calibration, then calibration can be performed, but measurement precision is reduced due to repositioning requirements and frequent recalibration
Solution Approach 1:
The patent merges the calibration function into the sensor device itself by integrating a calibration current terminal and calibration trace directly into the chip carrier. This eliminates the need for external magnetic field equipment and allows calibration to be performed internally by passing current through the calibration trace, which generates a known magnetic field at the sensor element location.
Solution Approach 2:
The sensor device performs calibration on its own using the integrated calibration structure. The calibration current terminal and trace are built-in components that enable the device to generate its own calibration magnetic field without requiring external equipment or manual repositioning, making the calibration process self-contained and automated.
2Adaptability or versatility
If sensor devices operate at different temperatures, then adaptability is improved, but measurement precision deteriorates due to temperature sensitivity
Solution Approach 1:
The patent performs calibration at multiple predetermined temperatures during the manufacturing process. By pre-calibrating the sensor at different temperature points (e.g., -40°C, 25°C, 85°C) and storing calibration data, the device can compensate for temperature effects during operation without requiring real-time recalibration, thus maintaining precision across a wide temperature range.
3Measurement precision
If calibration is performed at multiple temperatures, then measurement precision across temperature ranges is improved, but productivity is reduced due to repeated calibration steps
Solution Approach 1:
The patent performs all temperature-based calibration steps during the manufacturing process before the product is shipped. By pre-calibrating at multiple temperatures and storing the calibration data in memory, the device eliminates the need for repeated calibration during the product lifecycle, thus improving productivity while maintaining high measurement precision across temperature ranges.
4Measurement precision
If chip carrier shape is optimized for calibration, then measurement precision is improved, but manufacturing precision requirements increase
Solution Approach 1:
The patent uses simulation tools to optimize the calibration trace geometry and dimensions to generate the desired magnetic field distribution. By carefully designing the trace width, length, and positioning relative to the sensor element, the system achieves high calibration precision. The manufacturing tolerances are managed through robust design and simulation-based optimization rather than requiring extremely tight mechanical tolerances.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables precise calibration of sensor devices, achieving constant sensitivity across temperature and frequency ranges with improved accuracy and reduced positioning errors, and allows for calibration during manufacturing, eliminating the need for external magnetic fields.
Implementation Method 1
an electrical precalibration current flowing from the first precalibration current terminal to the second precalibration current terminal through the auxiliary structure induces a predefined precalibration magnetic field at the location of the sensor element
Implementation Method 2
a magnetic field sensor chip arranged on a mounting surface of the chip carrier, wherein the magnetic field sensor chip comprises a sensor element
Data Source
AI summary
A sensor device comprises an electrically conductive chip carrier, wherein the chip carrier comprises an auxiliary structure, wherein the auxiliary structure comprises a first precalibration current terminal and a second precalibration current terminal, a magnetic field sensor chip arranged on a mounting surface of the chip carrier, wherein the magnetic field sensor chip comprises a sensor element, wherein the shape of the auxiliary structure is embodied such that an electrical precalibration current flowing from the first precalibration current terminal to the second precalibration current terminal through the auxiliary structure induces a predefined precalibration magnetic field at the location of the sensor element, wherein during measurement operation of the precalibrated sensor device, no precalibration current flows between the first precalibration current terminal and the second precalibration current terminal.


