Sensor Calibration via Multi-Unit Quality Assessment
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Solution Overview
Problem
MEMS sensor systems face challenges in achieving high accuracy due to systematic errors such as offset, sensitivity, and temperature dependence, which change during manufacturing and device installation, making direct compensation complex and costly, and are further affected by environmental and operational conditions.
Innovation Solution
A method and system that utilize multiple sensor units, including a correction unit to determine and update correction data based on measuring signals from these units, with quality assessment to select the highest quality data for calibration, allowing continuous improvement and optimized power consumption.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If progressive determination of correction parameters over service life is used, then measurement precision is improved, but loss of time and energy consumption increase
Solution Approach 1:
The patent applies preliminary action by determining correction parameters during the manufacturing process before the sensor system is delivered to the customer. This includes performing calibration measurements in controlled environments and storing the determined correction parameters in memory, so that no further calibration is needed during the service life of the device.
Solution Approach 2:
The patent uses partial action by determining correction parameters for only the most significant systematic errors during manufacturing (such as offset and sensitivity), rather than attempting to correct all possible errors throughout the entire service life. This provides sufficient accuracy for most applications without requiring continuous calibration.
2Measurement precision
If progressive determination of correction parameters over service life is used, then measurement precision is improved, but use of energy increases
Solution Approach 1:
The patent applies preliminary action by determining correction parameters during the manufacturing process before the sensor system is delivered to the customer. This includes performing calibration measurements in controlled environments and storing the determined correction parameters in memory, so that no further calibration is needed during the service life of the device.
Solution Approach 2:
The patent applies self-service by having the sensor system use its own resources during manufacturing to determine and store correction parameters. The system is then self-sufficient during operation, using the pre-determined parameters without requiring additional energy-consuming calibration processes.
3Manufacturing precision
If component-specific correction parameters are determined, then manufacturing precision is improved, but device complexity increases
Solution Approach 1:
The patent applies universality by creating a standardized calibration process and data structure that can be applied to all sensor units of a given type. Correction parameters are stored in a uniform format in memory, allowing the same software and hardware infrastructure to handle calibration for all components without requiring custom solutions for each unit.
Solution Approach 2:
The patent applies preliminary action by determining correction parameters during the manufacturing process before the sensor system is delivered to the customer. This includes performing calibration measurements in controlled environments and storing the determined correction parameters in memory, so that no further calibration is needed during the service life of the device.
4Ease of operation
If correction parameters are determined during manufacturing, then ease of operation is improved, but manufacturing precision requirements increase
Solution Approach 1:
The patent applies preliminary action by determining correction parameters during the manufacturing process before the sensor system is delivered to the customer. This includes performing calibration measurements in controlled environments and storing the determined correction parameters in memory, so that no further calibration is needed during the service life of the device.
Solution Approach 2:
The patent applies feedback by using the measured systematic errors during manufacturing to automatically determine correction parameters that compensate for these errors. The calibration process measures actual sensor behavior and uses this feedback to calculate appropriate correction values that are then stored for ongoing use.
Data Source
AI summary
A method for calibrating a sensor system, including: providing at least one first sensor unit and one second sensor unit, providing first correction data for the first sensor unit on the basis of measuring signals of the first sensor unit, providing second correction data for the first sensor unit, in the case of an activated second sensor unit, on the basis of measuring signals of the first sensor unit and on the basis of measuring signals of the second sensor unit, determining a first quality parameter for the first correction data and a second quality parameter for the second correction data, determining present correction data for measuring signals of the first sensor unit based on the correction data having the highest of the two determined quality parameters, and calibrating the first sensor unit by correcting first measuring signals on the basis of the present correction data.