Sensor Chip Position Detection via Reflected Light Patterns
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Solution Overview
Problem
Existing position detection methods for sensor chips, particularly well chip type sensors, struggle to accurately determine the relative positional relationship between the well member and the prism, leading to potential displacement issues that affect the quality and accuracy of sample tests in surface plasmon-field enhanced fluorescence spectroscopy systems.
Innovation Solution
A position detection method and device that utilize an SPFS device with an excitation light irradiation unit, detection units, and a control unit to accurately determine the positional information between the dielectric member (prism) and the sample solution holding member (well member) by analyzing reflected light patterns, ensuring precise alignment and optimal sample test conditions.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the position of the sensor chip is adjusted with high accuracy by user, then the detection sensitivity and accuracy are improved, but the usability deteriorates
Solution Approach 1:
The sensor chip performs self-positioning by utilizing its own structural features (well member boundaries) to generate reflected light patterns that automatically indicate positional alignment, eliminating the need for manual adjustment by the user
Solution Approach 2:
The system detects positional information by analyzing changes in light reflection patterns (analogous to color changes), where the reflected light from the well member boundaries provides visual feedback on chip positioning
2Ease of manufacture
If the well member and prism are bonded manually, then the sensor chip can be assembled, but the relative positional relationship may be displaced
Solution Approach 1:
The positional relationship between the well member and prism is detected and verified before actual sample measurement, allowing correction or repositioning to be performed in advance to ensure proper alignment
Solution Approach 2:
The system provides feedback on the relative positional relationship between the well member and prism through reflected light detection, enabling verification and adjustment of alignment quality
3Measurement precision
If the incident angle of excitation light is adjusted manually, then the analyte detection sensitivity is improved, but the operation complexity increases
Solution Approach 1:
The sensor chip structure itself provides the reference for determining the optimal incident angle through its geometric features, allowing the system to automatically identify and use the correct angle without manual adjustment
Solution Approach 2:
The system changes the approach from manually adjusting the incident angle to automatically determining it based on the detected positional relationship between chip components, transforming a complex manual parameter adjustment into an automated process
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables high-accuracy and sensitive sample testing by ensuring the well member is within the predetermined range of the prism, improving usability and maintaining high sensitivity and accuracy without user intervention for sensor chip alignment.
Implementation Method 1
surface plasmon resonance (SPR) phenomenon
Implementation Method 2
excitation light such as laser light applied from a light source is subjected to attenuated total reflectance (ATR) on the surface of the metal film
Implementation Method 3
the excitation light reflected by the boundary surface of the sample solution holding member is incident on a light receiving sensor
Data Source
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AI summary
Provided is a position detection method and a position detection device for detecting a position of a sensor chip and obtaining relative positional information between a well member and a prism as for a well chip type sensor chip in which the well member is provided on a prism. By applying measurement light to the sensor chip while changing a distance between the sensor chip and a measurement light irradiation unit and detecting reflected light traveling in a predetermined direction out of the reflected light generated when the measurement light is reflected by the sensor chip, at least any one of the position of the sensor chip and the relative position between a dielectric member and a sample solution holding member is detected on the basis of a change in intensity of the detected reflected light.