High Temperature Sensor Circuit Upset Signal Attenuation
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Solution Overview
Problem
High-temperature sensor systems face challenges in accurately measuring parameters like pressure and temperature in harsh environments due to radiation-induced transient upsets, which can corrupt measurement signals.
Innovation Solution
A system comprising a sensor element, a passive compensation unit, an instrumentation amplifier, a scaler, and an upset event detector, which generates a filter based on bandwidth limitation, response time, and time rate of change of the measurement signal to attenuate upset signals and improve measurement accuracy.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Temperature
If sensors operate in high-temperature environments (150-300°C), then measurement capability in harsh conditions is improved, but radiation-induced transient upsets corrupt measurement signals
Solution Approach 1:
The patent implements preliminary detection of upset events using an upset event detector that identifies radiation-induced transients before they corrupt the measurement signal. The system proactively detects the presence of upset events and triggers compensation mechanisms in advance, preventing signal corruption rather than reacting after damage occurs.
Solution Approach 2:
The patent employs feedback through an upset event detector that continuously monitors the measurement signal for radiation-induced transients. When upsets are detected, the system feeds back correction information to compensate for the corrupted signal, creating a closed-loop system that maintains measurement accuracy despite harsh environmental conditions.
2Object-affected harmful factors
If high energy particles impact within circuits, then transient upsets occur in measured signals, but filtering mechanisms are needed to maintain accuracy
Solution Approach 1:
The patent introduces an intermediary upset event detector that acts as a mediator between the radiation environment and the measurement circuit. This detector specifically identifies upset events caused by high energy particles and triggers compensation mechanisms, serving as a buffer that protects the main measurement system from direct radiation effects.
Solution Approach 2:
The patent extracts and separates the upset detection function from the main measurement signal path. By using a dedicated upset event detector that operates independently, the system can identify and compensate for radiation-induced transients without interfering with the normal measurement process, effectively removing the harmful effect of upsets from the measurement output.
3Measurement precision
If passive compensation is used to correct non-radiation errors, then measurement accuracy is improved, but additional circuit complexity is introduced
Solution Approach 1:
The patent implements a multi-functional processor that handles both passive compensation for non-radiation errors and active compensation for radiation-induced upsets within a single integrated circuit. This universal approach consolidates multiple compensation functions into one device, reducing overall system complexity while maintaining comprehensive error correction capabilities.
Solution Approach 2:
The patent merges the upset event detector, passive compensation unit, and active compensation logic into an integrated signal processing chain. By combining these previously separate functions into a unified system, the patent reduces the number of discrete components and interconnections, thereby lowering device complexity while maintaining measurement precision.
Data Source
AI summary
Systems, devices, and methods for attenuating upset signals from measurement signals in high-temperature environments including an upset event detector configured to determine if an upset event exists in a measurement signal; and a processor in communication with the upset event detector, where the processor is configured to: compensate the measurement signal for the upset event if the upset event is determined to exist by the upset event detector.


