Temperature Sensor Self-Testing via Diode Voltage Comparison
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Solution Overview
Problem
Current temperature sensors lack an efficient self-testing mechanism to detect defects, which can lead to false warnings, device damage, or compromised calibration accuracy, and redundancy methods incur additional power and area costs.
Innovation Solution
A controller generates pairs of bias currents to determine diode voltage differences in a transistor assembly, allowing for the comparison of these differences to assess the functional and performance information of the temperature sensor, independent of environmental conditions, thereby detecting defects and ensuring calibration accuracy without additional hardware.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If redundancy is used to detect latent faults in a temperature sensor, then functional safety is improved, but power consumption and area increase
Solution Approach 1:
The temperature sensor performs self-testing by comparing its own output against expected temperature-dependent characteristics stored in memory, eliminating the need for external redundancy hardware. The sensor uses its intrinsic temperature response to validate its own functionality, thereby maintaining high reliability without additional power-consuming redundant components.
Solution Approach 2:
The temperature sensor serves dual functions: it provides temperature measurement for normal operation and simultaneously performs self-diagnosis for fault detection. By integrating both measurement and self-testing capabilities in a single sensor unit, the system achieves functional safety without requiring separate redundant sensors, thus reducing power consumption and area.
2Reliability
If redundancy is used to detect latent faults in a temperature sensor, then functional safety is improved, but device area increases
Solution Approach 1:
The temperature sensor performs self-testing by comparing its own output against expected temperature-dependent characteristics stored in memory, eliminating the need for external redundancy hardware. The sensor uses its intrinsic temperature response to validate its own functionality, thereby maintaining high reliability without additional area-consuming redundant components.
Solution Approach 2:
The temperature sensor serves dual functions: it provides temperature measurement for normal operation and simultaneously performs self-diagnosis for fault detection. By integrating both measurement and self-testing capabilities in a single sensor unit, the system achieves functional safety without requiring separate redundant sensors, thus reducing device area.
3Use of energy by moving object
If a single temperature sensor is used, then power and area are reduced, but the ability to detect defects is compromised
Solution Approach 1:
The system implements feedback-based self-diagnosis where the temperature sensor's output is continuously monitored and compared against expected temperature-dependent characteristics. When deviations are detected, the system can identify potential defects. This feedback mechanism enables a single sensor to detect defects that would otherwise require redundant sensors, maintaining reliability while minimizing power consumption.
Solution Approach 2:
The temperature sensor performs self-testing by comparing its own output against expected temperature-dependent characteristics stored in memory, eliminating the need for external redundancy hardware. The sensor uses its intrinsic temperature response to validate its own functionality, thereby maintaining high reliability without additional power-consuming redundant components.
4Device complexity
If calibration is performed without self-testing, then the process is simpler, but calibration accuracy is compromised due to undetected defects
Solution Approach 1:
The system performs preliminary self-testing and validation of the temperature sensor before calibration is executed. By checking the sensor's functionality and comparing its response against expected characteristics in advance, the system ensures that calibration is only performed on functional sensors. This preliminary action prevents wasted calibration efforts on defective sensors while maintaining a relatively simple overall process.
Solution Approach 2:
The system implements feedback-based self-diagnosis where the temperature sensor's output is continuously monitored and compared against expected temperature-dependent characteristics. When deviations are detected, the system can identify potential defects. This feedback mechanism enables a single sensor to detect defects that would otherwise require redundant sensors, maintaining reliability while minimizing power consumption.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This method provides a reliable and efficient self-testing scheme for temperature sensors, detecting defects and ensuring accurate calibration, while reducing power and area costs by reusing existing hardware, thus enhancing functional safety and performance.
Implementation Method 1
determine a first diode voltage difference of the transistor assembly corresponding to the first pair of bias currents
Implementation Method 2
determine a first diode voltage difference of the transistor assembly corresponding to the first pair of bias currents. Further, the controller is configured to cause generation of a second pair of bias currents
Data Source
AI summary
In accordance with an embodiment, a controller to operate a temperature sensor comprising a transistor assembly is configured to: cause a generation of a first pair of bias currents comprising a first bias current and a second bias current for the transistor assembly; determine a first diode voltage difference of the transistor assembly corresponding to the first pair of bias currents; cause a generation of a second pair of bias currents comprising a third bias current and a fourth bias current for the transistor assembly; determine a second diode voltage difference for the transistor assembly corresponding to the second pair of bias currents; and compare the first diode voltage difference and the second diode voltage difference to determine at least one of functional information and performance information of the temperature sensor.