Sensor Electrode Path Error Diagnosis via Internal Diagnostic Mechanism
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Solution Overview
Problem
Capacitive sensing input devices face challenges in diagnosing errors in sensor electrode paths, such as shorts and opens, which can lead to faulty devices and increased production costs due to the need for external testing and potential device disposal.
Innovation Solution
A processing system with internal diagnostic mechanisms, including selectable current sources and diagnostic circuits, is integrated into the input device to test sensor electrode paths for continuity and ohmic coupling, allowing for in-situ detection of errors and identification of their location within the device.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If external testing is used to diagnose sensor electrode path errors, then measurement precision can be achieved, but device complexity increases and production costs increase
Solution Approach 1:
The patent combines the diagnostic testing functionality with the existing sensor electrode paths by integrating a current source and voltage measurement capabilities directly into the sensor controller. This merging eliminates the need for separate external testing equipment, thereby maintaining measurement precision while reducing device complexity and production costs.
Solution Approach 2:
The sensor controller performs self-diagnosis by using its own resources (current source, voltage measurement circuitry) to test the sensor electrode paths for errors such as shorts and opens. This self-service approach removes the dependency on external testing equipment, simplifying the overall system while preserving diagnostic accuracy.
2Reliability
If external testing is used to diagnose sensor electrode path errors, then error detection capability is improved, but production costs increase
Solution Approach 1:
The diagnostic functionality is merged with the sensor controller's existing circuitry, combining error detection capability with the control function. This integration eliminates the need for separate testing equipment, maintaining reliable error detection while reducing production costs by simplifying the manufacturing process.
Solution Approach 2:
The sensor controller performs self-testing using its own current source and voltage measurement capabilities, eliminating the need for external testing equipment. This self-service approach maintains high reliability in error detection while reducing production costs by removing the need for additional testing hardware and associated manufacturing steps.
3Manufacturing precision
If sensor electrode paths are tested for continuity and ohmic coupling, then manufacturing precision is improved, but device complexity increases
Solution Approach 1:
The patent merges the diagnostic circuitry (current source and voltage measurement) with the sensor controller's existing architecture. This integration enables continuity and ohmic coupling tests of sensor electrode paths while maintaining manufacturing precision, without significantly increasing device complexity since the testing functionality shares hardware resources with the normal sensing operation.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution enables efficient and cost-effective error diagnosis within the input device, preventing faulty products from entering the market and allowing for targeted repair or reuse of components, thereby reducing waste and production costs.
Implementation Method 1
The sensing module is configured to couple with a first sensor electrode path of a plurality of sensor electrode paths, and is configured to drive the first sensor electrode path with a first signal
Implementation Method 2
The determination module is configured to determine whether the first and second sensor electrode paths are ohmically coupled together based on the test signal output
Data Source
AI summary
A processing system comprises a sensing module, a first internal diagnostic mechanism, and a determination module. The sensing module is configured to couple with a first sensor electrode path of a plurality of sensor electrode paths, wherein the sensing module is configured to drive the first sensor electrode path with a first signal. The first internal diagnostic mechanism configured to couple with a second sensor electrode path and configured to acquire a test signal output while the sensing module drives the first sensor electrode path with the first signal. The first internal diagnostic mechanism comprises a selectable current source configured to couple with the second sensor electrode path, and wherein the selectable current source is enabled during acquisition of the test signal output. The determination module configured to determine whether the first and second sensor electrode paths are ohmically coupled together based on the test signal output.