Sensor Layer Defect Detection Using Elevated Frequency Testing
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Solution Overview
Problem
Existing electronic device testing methods lack reliability in detecting defects in sensor layers, particularly due to the inability to accurately identify open circuits and micro open defects at touch drive frequencies.
Innovation Solution
A testing method that involves providing an electronic device with a display layer and a sensor layer, applying a test signal with a frequency higher than the touch drive frequency to the sensor layer's electrodes, measuring mutual capacitance, and determining defectiveness based on capacitance differences.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If testing is performed at touch drive frequency, then the sensor layer operates under normal conditions, but defects such as open circuits and micro open defects cannot be accurately detected
Solution Approach 1:
The patent applies preliminary action by performing defect detection testing at elevated frequencies before final product deployment. The method involves applying a test signal at a frequency higher than the touch drive frequency to detect open circuits and micro open defects in the sensor layer, thereby identifying defects before the product reaches the customer.
Solution Approach 2:
The patent applies parameter changes by modifying the test signal frequency parameter to be higher than the normal touch drive frequency. This frequency parameter change enables the detection of defects such as open circuits and micro open defects that are not detectable at normal operating frequencies, thereby improving defect detection accuracy.
2Measurement precision
If testing methods are simplified, then ease of operation improves, but measurement precision of sensor layer defects deteriorates
Solution Approach 1:
The patent applies parameter changes by using a test signal frequency higher than the touch drive frequency. This single parameter modification enables precise detection of open circuits and micro open defects while maintaining operational simplicity through automated measurement and comparison processes.
Solution Approach 2:
The patent applies mechanics substitution by replacing complex multi-frequency testing procedures with a simplified elevated frequency testing method. The controller automatically applies the test signal, measures mutual capacitance, compares results with reference values, and determines defectiveness, eliminating the need for manual complex testing procedures.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This method enhances the reliability of electronic device testing by effectively identifying defects in sensor layers, including open circuits and micro open defects, thereby ensuring the quality and functionality of the electronic devices.
Implementation Method 1
measuring mutual capacitance with the plurality of first electrodes through the plurality of second electrodes
Data Source
AI summary
In a method for testing an electronic device, the method includes: providing an electronic device including a display layer and a sensor layer on the display layer and configured to operate at a touch drive frequency, the sensor layer including a plurality of first electrodes and a plurality of second electrodes insulatively intersecting the plurality of first electrodes; providing a test signal having a test frequency higher than the touch drive frequency to the plurality of first electrodes; measuring mutual capacitance with the plurality of first electrodes through the plurality of second electrodes; and determining whether or not the sensor layer is defective, based on the mutual capacitance.