Sensor Self-Test Means for Precision Deviation Detection
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Solution Overview
Problem
Existing electronic sensors lack the ability to detect subtle deviations in precision, particularly for high-precision sensors with relative tolerances better than 10^-3 or 10^-4, leading to potential measurement errors that can have serious consequences, especially in applications like aircraft altitude measurement.
Innovation Solution
The sensor incorporates means to measure both primary and secondary parameters, with secondary parameters having known and unknown influences, allowing for the calculation of a physical quantity's estimate and automatic modification of the measurement based on detected deviations, using a basic and more complete mathematical model.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the sensor uses a basic mathematical model with only primary parameters for measurement, then the device complexity is low, but the measurement precision deteriorates due to undetected deviations from secondary parameters
Solution Approach 1:
The sensor divides parameters into primary parameters (directly influencing measurement) and secondary parameters (indirectly influencing measurement). This segmentation allows the system to monitor only critical secondary parameters that have known or unknown influences on measurement precision, rather than all possible parameters, thus balancing precision improvement with complexity management.
Solution Approach 2:
The patent introduces an intermediary self-test device that acts as a mediator between the basic measurement model and the actual sensor state. This intermediary monitors secondary parameters and detects deviations without requiring a complete complex model of all sensor behaviors, enabling precision improvement while maintaining relatively simple device architecture.
2Measurement precision
If the sensor monitors only gross failures using existing self-test means, then the device complexity remains low, but the measurement precision deteriorates due to inability to detect subtle precision deviations
Solution Approach 1:
Instead of implementing comprehensive monitoring of all possible sensor parameters, the patent applies partial action by monitoring only specific secondary parameters that have known or unknown influences on measurement precision. This selective approach detects subtle precision deviations without requiring excessive complexity in the self-test means.
Solution Approach 2:
The patent changes the monitoring approach from detecting only gross failures (binary state) to detecting subtle precision deviations (continuous parameter variation). By monitoring secondary parameters for small deviations beyond just failure detection, the system achieves higher precision detection capability while maintaining manageable device complexity through targeted parameter selection.
3Reliability
If the sensor automatically modifies measurements based on secondary parameter deviations, then the reliability of measurements is improved, but the device complexity increases due to additional calculation means and models
Solution Approach 1:
The patent applies preliminary action by pre-characterizing the sensor to identify which secondary parameters have known or unknown influences on measurement precision. This preliminary characterization is stored in the device, allowing the sensor to automatically modify measurements based on pre-established relationships without requiring complex real-time analysis, thus improving reliability while managing calculation means complexity.
Solution Approach 2:
The patent implements feedback by continuously monitoring secondary parameters and automatically modifying measurements when deviations are detected. The self-test device provides feedback information about secondary parameter states to the calculation means, which then adjusts the measurement output accordingly. This feedback mechanism improves measurement reliability while keeping the calculation logic relatively simple through rule-based adjustments rather than complex optimization algorithms.
4Measurement precision
If no calibration reference is available for re-calibration, then the ease of operation is high, but the measurement precision deteriorates due to inability to correct sensor drift
Solution Approach 1:
The patent applies self-service by enabling the sensor to perform its own characterization and self-testing without requiring external calibration references. The sensor automatically identifies its secondary parameters, establishes their relationships with measurement precision, and uses this self-acquired knowledge to detect and correct precision deviations. This self-service capability achieves precision correction while maintaining ease of operation through automated processes that require no external intervention or complex calibration equipment.
Data Source
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AI summary
The invention relates to electronic sensors providing precise digital measurements of the value of a physical quantity within a specified tolerance. A pressure sensor (for example) is sensitive to influencing parameters (pressure, temperature) and measures these parameters as primary parameters (for example, two frequencies Fr, Ft) for calculating the pressure to be measured. For self-testing, secondary parameters, measurable by the sensor itself, are also used. These secondary parameters are not used in calculating the pressure to be measured but are monitored. Examples of secondary parameters include the Q factor of the resonance of a vibrating beam of the pressure sensor, a bias voltage for the feedback loop controlling the resonance excitation, power consumption, etc.A discrepancy between a numerical model's estimate of a secondary parameter based on other parameters and the actual measurement of that parameter indicates a risk of loss of accuracy and is useful for diagnosing the sensor's health. Self-adjustment of the measurement can be predicted if the sensitivity of the measurement to variations in this secondary parameter is known. It is sometimes also possible to predict, for certain secondary parameters, the duration for which the specified accuracy can be maintained.