Sensor Signal Conditioning Circuit Simultaneous Testing
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Solution Overview
Problem
Simultaneous performance compensation testing of sensor and signal conditioning circuits is impractical in high-pressure and high-temperature environments due to complexity, cost, and time-consuming setups, often resulting in separate testing of the signal conditioning circuit, which increases overall cycle time and costs.
Innovation Solution
A sensor system and method that includes a resistance bridge circuit, signal conditioning circuit, and test connectors, allowing for simultaneous performance compensation testing by varying impedance at different temperatures using an impedance test device, enabling characterization and compensation of both circuits simultaneously.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If simultaneous performance compensation testing is conducted on sensor and signal conditioning circuit in high-pressure and high-temperature environments, then testing accuracy and reliability are improved, but device complexity and testing costs increase
Solution Approach 1:
The patent divides the testing system into separate functional modules: a temperature chamber for environmental conditioning, an impedance test device for electrical measurements, and a sensor system with integrated test connectors. This segmentation allows each component to be optimized independently while maintaining simultaneous testing capability, thereby improving reliability without proportionally increasing overall complexity.
Solution Approach 2:
The signal conditioning circuit is designed with multi-functionality, serving both as the operational circuit for sensor signal processing and as the test object for performance compensation characterization. The same circuit handles both sensor excitation/conditioning and provides test access points for impedance measurements, eliminating the need for separate dedicated test equipment and reducing overall device complexity.
2Productivity
If simultaneous performance compensation testing is conducted on sensor and signal conditioning circuit, then overall testing time is reduced, but testing setup complexity increases
Solution Approach 1:
The patent merges the sensor testing and signal conditioning circuit testing into a single integrated test setup. The impedance test device connects to both the sensor output and the signal conditioning circuit through shared test connectors, allowing simultaneous characterization of both components under identical environmental conditions. This consolidation achieves time efficiency by eliminating sequential testing requirements while managing complexity through shared infrastructure.
Solution Approach 2:
The patent introduces test connectors as intermediary elements that facilitate simultaneous access to both the sensor and signal conditioning circuit. These connectors serve as mediation points where the impedance test device can inject test signals and measure responses from both the sensor and the conditioning circuit without interfering with each other's operation, enabling parallel testing while maintaining system integrity.
3Device complexity
If separate performance testing is conducted on signal conditioning circuit, then testing setup complexity is reduced, but overall cycle time increases
Solution Approach 1:
The patent implements preliminary action by pre-configuring the signal conditioning circuit with integrated test access points and test connectors during the manufacturing process. This preliminary preparation allows the circuit to be immediately tested in-situ after assembly, eliminating the need for separate post-assembly testing setups. The test infrastructure is built-in beforehand, enabling time-efficient simultaneous testing without requiring complex external test equipment configurations.
4Ease of manufacture
If in-situ performance compensation testing is implemented, then testing costs are reduced, but manufacturing precision requirements increase
Solution Approach 1:
The patent uses the existing sensor output signal as a copy or representation of the signal conditioning circuit's performance. Instead of requiring separate dedicated test signals and complex routing, the system utilizes the actual operational output of the sensor-conditioning system as the test input. This copying approach allows performance compensation characterization using the system's own operational signals, reducing manufacturing precision requirements for dedicated test infrastructure while maintaining testing accuracy.
Data Source
AI summary
A sensor system with performance compensation testing capability includes a sensor device, a resistance bridge, a signal conditioning circuit, a first test connector, and a second test connector. The resistance bridge circuit is disposed on the sensor device and includes an excitation terminal, a circuit common terminal, and two output terminals, and is configured, upon being energized, to supply a bridge output voltage across the two output terminals. The signal conditioning circuit is electrically coupled to the excitation terminal, the circuit common terminal, and the two output terminals, and is configured to supply a sensor output signal representative of bridge output voltage. The first test connector is electrically coupled to one of the two output terminals and is configured to be coupled to an impedance test device. The second test connector is electrically coupled to the circuit common terminal and is configured to be coupled to the impedance test device.