Manufacturing Abnormality Detection Using Sensor Statistics Offload

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Solution Overview

Problem

Existing abnormality detection systems for manufacturing devices, such as injection molding machines, impose excessive load on control devices when detecting and diagnosing abnormalities, leading to delays in operation control processing.

Innovation Solution

An abnormality detection system comprising a control device for operation control and an abnormality detection apparatus that receives operating data, acquires sensor value data, calculates statistics, and determines abnormalities without overloading the control device, using a communication unit to transmit results, allowing concurrent abnormality detection and diagnosis.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If the control device is configured to detect or diagnose an abnormality of the manufacturing device, then abnormality detection capability is improved, but operation control processing is delayed

Engineering Contradiction:
Improveabnormality detection capabilityVSAvoidoperation control processing time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The system divides the abnormality detection and diagnosis functions into a separate abnormality detection apparatus that operates independently from the control device. The control device focuses on operation control while the abnormality detection apparatus handles sensor data acquisition, statistics calculation, and abnormality determination, eliminating processing delays in the control device.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The abnormality detection apparatus acts as an intermediary between the sensors and the control device. It receives sensor value data, processes it to calculate statistics and determine abnormalities, then transmits results to the control device, allowing concurrent operation without interfering with control processing timing.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Device complexity

If the control device performs both operation control and abnormality detection, then device complexity is reduced, but processing load increases excessively

Engineering Contradiction:
Improvesystem structureVSAvoidcontrol device processing load
Core Design Contradiction:
Device complexityVSUse of energy by moving object

Solution Approach 1:

The system segments functionality into two distinct components: the control device for operation control and the abnormality detection apparatus for detection and diagnosis. This segmentation distributes processing load appropriately, preventing excessive burden on the control device while maintaining relatively simple overall system structure through standardized interfaces.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The abnormality detection apparatus creates a separate processing instance that copies only the necessary detection and diagnosis functions from the control device, allowing independent operation without overloading the original control device while maintaining functional simplicity.

Inventive Principle:
Principle #26Copying

Data Source

PatentUS20240109234A1Abnormality Detection System, Molding Machine System, Abnormality Detection Apparatus, Abnormality Detection Method and Non-Transitory Computer Readable Recording Medium
Publication Date: 2024.04.04 THE JAPAN STEEL WORKS LTD
  • US20240109234A1 patent drawing
  • US20240109234A1 patent drawing
  • US20240109234A1 patent drawing

AI summary

An abnormality detection system includes an abnormality detection apparatus that detects an abnormality of a manufacturing device, a control device that performs operation control of the manufacturing device and transmits operating data, and a sensor that detects a physical quantity related to operation of the manufacturing device or a product manufactured by the manufacturing device and outputs sensor value data. The abnormality detection apparatus receives operating data transmitted from the control device, acquires sensor value data output from the sensor, calculates statistics of the sensor value data acquired, determines a presence or an absence of an abnormality of the manufacturing device based on the statistics calculated and a threshold depending on the operating data received, and transmits a determination result and the statistics to the control device.