Sensor System for Material Thickness Measurement

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Solution Overview

Problem

Existing interferometry scanning methods for determining material thickness are limited to measuring a small area, making it impossible to accurately determine material distribution over an extensive area of products like bottles, which hampers material savings, structural integrity, and optical properties.

Innovation Solution

A sensor system that combines IR absorption sensors for determining thickness at a lower accuracy over larger zones and interferometry sensors for higher accuracy over smaller zones, allowing a processor to integrate both data sets for improved thickness determination across the material body.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If interferometry scanning is used to determine material thickness, then measurement precision is improved, but the area of measurement is limited to a small region

Engineering Contradiction:
Improvethickness measurement accuracyVSAvoidmeasurement area
Core Design Contradiction:
Measurement precisionVSArea of stationary object

Solution Approach 1:

The patent divides the material body into multiple zones (first zone and second zone) and applies different measurement methods to each zone. The interferometry sensor measures a second zone with higher accuracy, while other zones are measured with lower accuracy methods, allowing comprehensive coverage without requiring expensive interferometry sensors for the entire surface.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent applies different measurement qualities to different regions of the material body. Critical areas (second zone) receive high-precision interferometry measurement, while non-critical areas (first zone) receive lower-precision measurement, optimizing resource allocation and reducing overall system cost while maintaining necessary measurement accuracy where needed.

Inventive Principle:
Principle #3Local quality

2Area of stationary object

If multiple interferometry sensors are deployed to cover extensive areas, then measurement area is improved, but device complexity and cost increase

Engineering Contradiction:
Improvemeasurement areaVSAvoidsensor system complexity
Core Design Contradiction:
Area of stationary objectVSDevice complexity

Solution Approach 1:

The patent segments the measurement system into two parts: a single interferometry sensor for critical zones and simpler sensors for other zones. This segmentation allows extensive area coverage without deploying multiple complex interferometry sensors, thereby reducing device complexity and cost while maintaining comprehensive measurement capability.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The sensor system is designed to perform multiple functions using a single interferometry sensor: it measures critical zones with high precision while the same sensor can be positioned to measure different areas sequentially. This multi-functionality eliminates the need for multiple specialized sensors, reducing system complexity.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Area of stationary object

If manual sampling and measurement is performed, then measurement area coverage is improved, but productivity is reduced due to time-consuming processes

Engineering Contradiction:
Improvematerial distribution coverageVSAvoidproduction line efficiency
Core Design Contradiction:
Area of stationary objectVSProductivity

Solution Approach 1:

The patent replaces manual mechanical measurement systems with automated optical sensing systems. The sensor system automatically measures material thickness across multiple zones without requiring physical contact or destruction of the product, eliminating the time-consuming manual sampling, preparation, and measurement processes while maintaining comprehensive area coverage.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The sensor system enables self-measurement of the material body without external intervention. The automated sensing and data processing allow the production system to monitor its own output quality in real-time, eliminating the need for separate manual inspection processes and improving overall productivity.

Inventive Principle:
Principle #25Self-service

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables more accurate determination of material thickness over extensive areas, leading to improved material savings, structural properties, and optical properties of material bodies, while also reducing the need for multiple expensive interferometry sensors.

Implementation Method 1

the at least one sensor comprises at least one IR absorption sensor and at least one interferometry sensor; the at least one IR absorption sensor is operable on the first zone of the body, to determine, at the first accuracy, the first data

Methodology Applied
Scientific EffectIR absorption: Absorption (EM radiation)

Implementation Method 2

the at least one sensor comprises at least one IR absorption sensor and at least one interferometry sensor; the at least one interferometry sensor is operable on the second zone of the body to determine, at the second accuracy, second data

Methodology Applied
Scientific EffectInterferometry: Interference

Data Source

PatentEP4341640B1Sensor system, method and use for determining a thickness of a material body
Publication Date: 2025.04.02 CARGILL INC
  • EP4341640B1 patent drawingFigure 1~2
  • EP4341640B1 patent drawingFigure 3~4

AI summary

Sensor system for determining a thickness of a material body, e.g. a container such as a bottle, comprising an IR absorption sensor operable on a first zone of the body, to determine, at a first accuracy, first data relating to a first parameter pertaining to thickness of the first zone; and comprising an interferometry sensor operable on a second zone of the body, to determine, at a second accuracy, second data relating to a second parameter pertaining to thickness of the second zone, the second accuracy being higher than the first accuracy; and wherein the sensor system is configured for providing the first data and the second data to a processor, the processor being configured for taking into account the first data as well as the second data to determine the thickness of the body over the first zone at an accuracy higher than the first accuracy.