Sensor Test Block for Computing Device Manufacturing Line

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Solution Overview

Problem

The existing methods for testing sensors in computing devices during manufacturing are time-consuming and costly due to the need for dedicated test stations, which increase the overall manufacturing process time and expenses.

Innovation Solution

Incorporating a sensor test block with a sensor hub and analysis block into the computing device to detect, collect, and analyze sensor readings during its movement along the manufacturing line, eliminating the need for dedicated test stations by using the device's motion and position changes to test sensor aliveness.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If dedicated test stations are used for sensor testing, then sensor testing can be performed, but manufacturing time increases by 2 to 5 minutes per device

Engineering Contradiction:

Improvesensor testing capabilityVSAvoidmanufacturing time

Core Design Contradiction:

ReliabilityVSLoss of time

Solution Approach 1:

The patent combines sensor testing operations with the existing device transport process between test stations. The device's natural movement along the manufacturing line is utilized to generate the motion required for sensor testing, merging two functions (testing and transport) into one continuous process without requiring separate dedicated test stations.

Inventive Principle:

Principle #5Merging (Combining)

Solution Approach 2:

The manufacturing line's device movement mechanism is given a dual function: it both transports devices between test stations and simultaneously provides the motion stimulus needed for sensor testing. This multi-functionality eliminates the need for additional dedicated testing equipment and time.

Inventive Principle:

Principle #6Universality (Multi-functionality)

2Reliability

If dedicated test stations are used for sensor testing, then sensor aliveness can be verified, but manufacturing cost increases

Engineering Contradiction:

Improvesensor aliveness verificationVSAvoidmanufacturing cost

Core Design Contradiction:

ReliabilityVSEase of manufacture

Solution Approach 1:

The device's own movement through the manufacturing line serves as the test stimulus for sensor verification. The system uses the device's inherent motion during normal manufacturing operations to self-test its sensors, eliminating the need for external dedicated testing equipment and reducing manufacturing costs.

Inventive Principle:

Principle #25Self-service

Solution Approach 2:

The patent replaces the mechanical system of dedicated test stations with the existing device transport mechanism. Instead of using separate equipment to move and test devices, the manufacturing line's conveyance system performs both functions, reducing equipment costs and simplifying the manufacturing process.

Inventive Principle:

Principle #28Mechanics substitution (Replace mechanical system)

Data Source

PatentUS10677618B2Testing of device sensors on a manufacturing line

Publication Date: 2020.06.09 INTEL CORP

AI summary

Embodiments of the present disclosure provide techniques for sensor testing for computing devices during initial movement of the device, such as movement on a manufacturing line. In one instance, a device with integral sensor testing during initial movement of the device may include a plurality of sensors and a sensor test block coupled with the plurality of sensors, to detect, collect and/or report readings provided by at least some of the sensors in response to movement of the device between at least a first test station and a second test station. Other embodiments may be described and/or claimed.