Sensor Testing Station Parallel Chamber Handling
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Solution Overview
Problem
Turret handlers are poorly suited for testing sensor devices that require both electrical and sensing property testing, as it significantly reduces throughput due to the lengthy testing time.
Innovation Solution
A method and apparatus that utilize a turret handler, a testing station with multiple test chambers, and a handling device to run phase-shifted test cycles, allowing parallel testing and maintaining a continuous stream of sensor devices to the turret handler, enabling efficient handling of sensor devices like humidity, temperature, flow, and gas sensors.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If sensor devices are tested for both electrical and sensing properties in a turret handler, then testing completeness is improved, but throughput deteriorates due to lengthy testing time
Solution Approach 1:
The system segments the testing process by dividing it into multiple parallel test chambers, each capable of independently testing batches of sensor devices. This allows the testing function to be split across multiple units, enabling concurrent testing operations that maintain comprehensive testing while increasing overall throughput
Solution Approach 2:
The system combines batch testing capability with sequential handling by integrating a testing station that processes batches of devices through multiple test chambers while a turret handler sequentially transports individual devices. This merging of batch and sequential approaches allows comprehensive testing without sacrificing throughput
2Ease of operation
If test cycles are run sequentially in a single test chamber, then device handling simplicity is improved, but productivity deteriorates due to slower testing rate
Solution Approach 1:
The system transitions from a single-dimensional sequential testing approach to a multi-dimensional parallel testing architecture by introducing multiple test chambers that operate simultaneously. Each chamber maintains simple sequential operation, but the system as a whole achieves higher productivity through parallel execution across multiple chambers
3Productivity
If the testing station processes devices in batches, then throughput is improved, but device-by-device handling complexity increases
Solution Approach 1:
The system introduces a handling device as an intermediary component that bridges the batch processing capability of the testing station and the individual device processing requirement of the turret handler. This intermediary manages the conversion between batch and individual device formats, enabling high throughput while maintaining simple handling at each interface
Data Source
AI summary
To process a plurality of sensor devices, such as humidity sensors or gas sensors, the sensor devices are run through a testing station and a turret handler. In order to increase throughput of the testing station, several test cycles are operated simultaneously in a phase-shifted manner. The sensor devices are e.g. sequentially fed onto trays of the test station, on which they are assembled in batches. Each batch is subjected to a test cycle. After the test cycle, the sensor devices of a batch are sequentially fed back to the turret handler.